The use of computer simulation to investigate tip shape and point contact effects during scanning tunneling microscopy of supported nanostructures

G.I. Márk, Laszlo P. Biró, J. Gyulai, Paul Thiry, Philippe Lambin

    Résultats de recherche: Contribution dans un livre/un catalogue/un rapport/dans les actes d'une conférenceChapitre

    langue originaleAnglais
    titreElectronic properties of novel materials -- Science and technology of molecular nanostructures (American Institute of Physics, Melville, 1999)
    Sous-titreScience and technology of molecular nanostructures
    rédacteurs en chefH Kuzmany, J Fink, M Mehring, S Roth
    Pages323-327
    Nombre de pages5
    Volume486
    Etat de la publicationPublié - 1999

    Contient cette citation

    Márk, G. I., Biró, L. P., Gyulai, J., Thiry, P., & Lambin, P. (1999). The use of computer simulation to investigate tip shape and point contact effects during scanning tunneling microscopy of supported nanostructures. Dans H. Kuzmany, J. Fink, M. Mehring, & S. Roth (eds.), Electronic properties of novel materials -- Science and technology of molecular nanostructures (American Institute of Physics, Melville, 1999): Science and technology of molecular nanostructures (Vol 486, p. 323-327)