The Sm/Si(100) interface studied by electron spectroscopy

Jens Onsgaard, Jacques Ghijsen, Robert L. Johnson, F. Ørskov, Ib Chorkendorff, François Grey

Résultats de recherche: Contribution à un journal/une revue › Article › Revue par des pairs

langue originale	Anglais
Pages (de - à)	67-78
Nombre de pages	12
journal	Journal of Electron Spectroscopy and Related Phenomena
Volume	52
Etat de la publication	Publié - 1990
Modification externe	Oui

Contient cette citation

@article{ac9e9dd9ddde4b2e918ec1f6082d50aa,

title = "The Sm/Si(100) interface studied by electron spectroscopy",

author = "Jens Onsgaard and Jacques Ghijsen and Johnson, {Robert L.} and F. {\O}rskov and Ib Chorkendorff and Fran{\c c}ois Grey",

year = "1990",

language = "English",

volume = "52",

pages = "67--78",

journal = "Journal of Electron Spectroscopy and Related Phenomena",

issn = "0368-2048",

publisher = "Elsevier",

}

TY - JOUR

T1 - The Sm/Si(100) interface studied by electron spectroscopy

AU - Onsgaard, Jens

AU - Ghijsen, Jacques

AU - Johnson, Robert L.

AU - Ørskov, F.

AU - Chorkendorff, Ib

AU - Grey, François

PY - 1990

Y1 - 1990

M3 - Article

SN - 0368-2048

VL - 52

SP - 67

EP - 78

JO - Journal of Electron Spectroscopy and Related Phenomena

JF - Journal of Electron Spectroscopy and Related Phenomena

ER -