The influence of tunneling voltage on the imaging of carbon nanotubes rafts by scanning tunneling microscopy

Laszlo P. Biró, Paul Thiry, Philippe Lambin, Catherine Journet, Patrick Bernier, Amand Lucas

Résultats de recherche: Contribution à un journal/une revueArticle

langue originaleAnglais
Pages (de - à)3680-3682
Nombre de pages3
journalApplied Physics Letters
Volume73
étatPublié - 1998

Citer ceci

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title = "The influence of tunneling voltage on the imaging of carbon nanotubes rafts by scanning tunneling microscopy",
author = "Bir{\'o}, {Laszlo P.} and Paul Thiry and Philippe Lambin and Catherine Journet and Patrick Bernier and Amand Lucas",
year = "1998",
language = "English",
volume = "73",
pages = "3680--3682",
journal = "Appl. Phys. Lett.",
issn = "0003-6951",
publisher = "American Institute of Physics Publising LLC",

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The influence of tunneling voltage on the imaging of carbon nanotubes rafts by scanning tunneling microscopy. / Biró, Laszlo P.; Thiry, Paul; Lambin, Philippe; Journet, Catherine; Bernier, Patrick; Lucas, Amand.

Dans: Applied Physics Letters, Vol 73, 1998, p. 3680-3682.

Résultats de recherche: Contribution à un journal/une revueArticle

TY - JOUR

T1 - The influence of tunneling voltage on the imaging of carbon nanotubes rafts by scanning tunneling microscopy

AU - Biró, Laszlo P.

AU - Thiry, Paul

AU - Lambin, Philippe

AU - Journet, Catherine

AU - Bernier, Patrick

AU - Lucas, Amand

PY - 1998

Y1 - 1998

M3 - Article

VL - 73

SP - 3680

EP - 3682

JO - Appl. Phys. Lett.

JF - Appl. Phys. Lett.

SN - 0003-6951

ER -