Surface and interface phonons of CaF2 epitaxial layers on Si(111) measured by high resolution electron energy loss spectroscopy

Paul Thiry, Jean-Louis Longueville, Roland Caudano

Résultats de recherche: Contribution à un journal/une revue › Article

langue originale	Anglais
Pages (de - à)	1670-1675
Nombre de pages	6
journal	Journal of Vacuum Science and Technology A
Volume	9
Numéro de publication	3
Etat de la publication	Publié - 1991

Contient cette citation

@article{fdf9463bec1a4300b248e61513ad5d8e,

title = "Surface and interface phonons of CaF2 epitaxial layers on Si(111) measured by high resolution electron energy loss spectroscopy",

author = "Paul Thiry and Jean-Louis Longueville and Roland Caudano",

year = "1991",

language = "English",

volume = "9",

pages = "1670--1675",

journal = "Journal of Vacuum Science and Technology A",

publisher = "AVS Science and Technology Society",

number = "3",

}

TY - JOUR

T1 - Surface and interface phonons of CaF2 epitaxial layers on Si(111) measured by high resolution electron energy loss spectroscopy

AU - Thiry, Paul

AU - Longueville, Jean-Louis

AU - Caudano, Roland

PY - 1991

Y1 - 1991

M3 - Article

VL - 9

SP - 1670

EP - 1675

JO - Journal of Vacuum Science and Technology A

JF - Journal of Vacuum Science and Technology A

IS - 3

ER -