Study of the Pd-Rh interdiffusion by three complementary analytical techniques: PIXE, RBS and ToF-SIMS

R.L. Hubert; J. Brison; L. Houssiau; S. Lucas

doi:10.1016/j.nimb.2005.06.167

Study of the Pd-Rh interdiffusion by three complementary analytical techniques: PIXE, RBS and ToF-SIMS

R.L. Hubert, J. Brison, L. Houssiau, S. Lucas

Namur Research Institute for Life Sciences

Résultats de recherche: Contribution à un journal/une revue › Article › Revue par des pairs

Résumé

Pd diffusion in Rh has a great interest in the Pd* production intended to brachytherapy, a cancer treatment using radioactive implants. In order to study that diffusion, DC-magnetron sandwich layers of natural Pd and Rh were produced, annealed, and the Pd profiles were measured by ToF-SIMS. Nevertheless, because ToF-SIMS depth profiles suffer from a lack of quantification and depth calibration, the study was completed by RBS, PIXE. The combination of these techniques allowed us to convert the ToF-SIMS depth profiles from an intensity-time to a concentration-depth profile and thus to study the Pd diffusion in Rh.

langue originale	Anglais
Pages (de - à)	420-424
Nombre de pages	5
journal	Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume	240
Numéro de publication	1-2
Les DOIs	https://doi.org/10.1016/j.nimb.2005.06.167
Etat de la publication	Publié - 1 oct. 2005

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10.1016/j.nimb.2005.06.167

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@article{7e9a3c6cef164bebba4135c0c4cc5724,

title = "Study of the Pd-Rh interdiffusion by three complementary analytical techniques: PIXE, RBS and ToF-SIMS",

abstract = "Pd diffusion in Rh has a great interest in the Pd* production intended to brachytherapy, a cancer treatment using radioactive implants. In order to study that diffusion, DC-magnetron sandwich layers of natural Pd and Rh were produced, annealed, and the Pd profiles were measured by ToF-SIMS. Nevertheless, because ToF-SIMS depth profiles suffer from a lack of quantification and depth calibration, the study was completed by RBS, PIXE. The combination of these techniques allowed us to convert the ToF-SIMS depth profiles from an intensity-time to a concentration-depth profile and thus to study the Pd diffusion in Rh.",

author = "R.L. Hubert and J. Brison and L. Houssiau and S. Lucas",

year = "2005",

month = oct,

day = "1",

doi = "10.1016/j.nimb.2005.06.167",

language = "English",

volume = "240",

pages = "420--424",

journal = "Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms",

issn = "0168-583X",

publisher = "Elsevier",

number = "1-2",

}

Study of the Pd-Rh interdiffusion by three complementary analytical techniques: PIXE, RBS and ToF-SIMS. / Hubert, R.L.; Brison, J.; Houssiau, L. et al.
Dans: Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, Vol 240, Numéro 1-2, 01.10.2005, p. 420-424.

Résultats de recherche: Contribution à un journal/une revue › Article › Revue par des pairs

TY - JOUR

T1 - Study of the Pd-Rh interdiffusion by three complementary analytical techniques

T2 - PIXE, RBS and ToF-SIMS

AU - Hubert, R.L.

AU - Brison, J.

AU - Houssiau, L.

AU - Lucas, S.

PY - 2005/10/1

Y1 - 2005/10/1

N2 - Pd diffusion in Rh has a great interest in the Pd* production intended to brachytherapy, a cancer treatment using radioactive implants. In order to study that diffusion, DC-magnetron sandwich layers of natural Pd and Rh were produced, annealed, and the Pd profiles were measured by ToF-SIMS. Nevertheless, because ToF-SIMS depth profiles suffer from a lack of quantification and depth calibration, the study was completed by RBS, PIXE. The combination of these techniques allowed us to convert the ToF-SIMS depth profiles from an intensity-time to a concentration-depth profile and thus to study the Pd diffusion in Rh.

AB - Pd diffusion in Rh has a great interest in the Pd* production intended to brachytherapy, a cancer treatment using radioactive implants. In order to study that diffusion, DC-magnetron sandwich layers of natural Pd and Rh were produced, annealed, and the Pd profiles were measured by ToF-SIMS. Nevertheless, because ToF-SIMS depth profiles suffer from a lack of quantification and depth calibration, the study was completed by RBS, PIXE. The combination of these techniques allowed us to convert the ToF-SIMS depth profiles from an intensity-time to a concentration-depth profile and thus to study the Pd diffusion in Rh.

UR - http://www.scopus.com/inward/record.url?scp=27444437582&partnerID=8YFLogxK

U2 - 10.1016/j.nimb.2005.06.167

DO - 10.1016/j.nimb.2005.06.167

M3 - Article

AN - SCOPUS:27444437582

SN - 0168-583X

VL - 240

SP - 420

EP - 424

JO - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

JF - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

IS - 1-2

ER -

Study of the Pd-Rh interdiffusion by three complementary analytical techniques: PIXE, RBS and ToF-SIMS

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