Study of the interface between rhodium and carbon nanotubes

Irène Suarez-Martinez, Chistopher P. Ewels, Xiaoxing Ke, Gustaaf Van Tendeloo, Sebastian Thiess, Wolfgang Drube, A. Felten, J.-J. Pireaux, J. Ghijsen, Carla Bittencourt

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Résumé

X-ray photoelectron spectroscopy at 3.5 keV photon energy, in combination with high-resolution transmission electron microscopy, is used to follow the formation of the interface between rhodium and carbon nanotubes. Rh nucleates at defect sites, whether initially present or induced by oxygen-plasma treatment. More uniform Rh cluster dispersion is observed on plasma-treated CNTs. Experimental results are compared to DFT calculations of small Rh clusters on pristine and defective graphene. While Rh interacts as strongly with the carbon as Ti, it is less sensitive to the presence of oxygen, suggesting it as a good candidate for nanotube contacts.
langue originaleAnglais
Pages (de - à)1680-1686
Nombre de pages7
journalACS nano
Volume4
Numéro de publication3
Les DOIs
Etat de la publicationPublié - 23 mars 2010

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Contient cette citation

Suarez-Martinez, I., Ewels, C. P., Ke, X., Van Tendeloo, G., Thiess, S., Drube, W., Felten, A., Pireaux, J-J., Ghijsen, J., & Bittencourt, C. (2010). Study of the interface between rhodium and carbon nanotubes. ACS nano, 4(3), 1680-1686. https://doi.org/10.1021/nn9015955