Study of the CdTe/As/Si(111) interface by scanning tunneling microscopy and X-ray photoelectron spectroscopy

Frédéric Wiame; Saroj Rujirawat; Greg Brill; Yan Xin; Roland Caudano; Siva Sivananthan; Nigel Browning; Robert Sporken

Study of the CdTe/As/Si(111) interface by scanning tunneling microscopy and X-ray photoelectron spectroscopy

Frédéric Wiame, Saroj Rujirawat, Greg Brill, Yan Xin, Roland Caudano, Siva Sivananthan, Nigel Browning, Robert Sporken

Résultats de recherche: Contribution à un journal/une revue › Article

langue originale	Anglais
Pages (de - à)	818-822
Nombre de pages	5
journal	Surface Science
Numéro de publication	454-456
Etat de la publication	Publié - 2000

Contient cette citation

@article{7b0e8db34cf94a4ea351cbabc1be8597,

title = "Study of the CdTe/As/Si(111) interface by scanning tunneling microscopy and X-ray photoelectron spectroscopy",

author = "Fr{\'e}d{\'e}ric Wiame and Saroj Rujirawat and Greg Brill and Yan Xin and Roland Caudano and Siva Sivananthan and Nigel Browning and Robert Sporken",

note = "Publication code : **RES. ACAD.",

year = "2000",

language = "English",

pages = "818--822",

journal = "Surface Science",

publisher = "Elsevier",

number = "454-456",

}

TY - JOUR

T1 - Study of the CdTe/As/Si(111) interface by scanning tunneling microscopy and X-ray photoelectron spectroscopy

AU - Wiame, Frédéric

AU - Rujirawat, Saroj

AU - Brill, Greg

AU - Xin, Yan

AU - Caudano, Roland

AU - Sivananthan, Siva

AU - Browning, Nigel

AU - Sporken, Robert

N1 - Publication code : **RES. ACAD.

PY - 2000

Y1 - 2000

M3 - Article

SP - 818

EP - 822

JO - Surface Science

JF - Surface Science

IS - 454-456

ER -