Study of annatto from Bixa orellana seeds: An application of time-of-flight secondary ion mass spectrometry

C. Bittencourt, M.P. Felicissimo, J.-J. Pireaux, L. Houssiau

Résultats de recherche: Contribution à un journal/une revueArticleRevue par des pairs

Résumé

The use of time-of-flight secondary ion mass spectrometry (ToF-SIMS) to analyze natural samples is discussed. The technique allows preventive measures such as protection from light, temperature control, inert atmosphere, and no solvent use to be achieved during the analysis. It is shown that the technique allows the direct measurement on the seed, which is considered to be a new possibility for the analysis of natural samples. The molecular sensitivity of ToF-SIMS has been shown to allow the straightforward detection of the main constituents present in annatto seeds, with potential applications in food industry.
langue originaleAnglais
Pages (de - à)16-22
Nombre de pages7
journalSpectroscopy Europe
Volume17
Numéro de publication2
Etat de la publicationPublié - 1 avr. 2005

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