Résumé
The use of time-of-flight secondary ion mass spectrometry (ToF-SIMS) to analyze natural samples is discussed. The technique allows preventive measures such as protection from light, temperature control, inert atmosphere, and no solvent use to be achieved during the analysis. It is shown that the technique allows the direct measurement on the seed, which is considered to be a new possibility for the analysis of natural samples. The molecular sensitivity of ToF-SIMS has been shown to allow the straightforward detection of the main constituents present in annatto seeds, with potential applications in food industry.
langue originale | Anglais |
---|---|
Pages (de - à) | 16-22 |
Nombre de pages | 7 |
journal | Spectroscopy Europe |
Volume | 17 |
Numéro de publication | 2 |
Etat de la publication | Publié - 1 avr. 2005 |
Empreinte digitale
Examiner les sujets de recherche de « Study of annatto from Bixa orellana seeds: An application of time-of-flight secondary ion mass spectrometry ». Ensemble, ils forment une empreinte digitale unique.Équipement
-
Synthèse, Irradiation et Analyse de Matériaux (SIAM) (2016 - ...)
Pierre Louette (!!Manager), Julien Colaux (!!Manager), Alexandre Felten (!!Manager), Tijani Tabarrant (!!Operator), Frederic COME (!!Operator) & Paul-Louis Debarsy (!!Manager)
Plateforme technologique Synthese, irradiation et analyse des materiauxEquipement/installations: Plateforme technolgique