Structure and properties of carbon onion layers deposited onto various substrates

T. Cabioc'h, E. Thune, J.P. Rivière, S. Camelio, J.C. Girard, P. Guérin, M. Jaouen, L. Henrard, Philippe Lambin

Résultats de recherche: Contribution à un journal/une revueArticle

Résumé

120 keV carbon ions implantations at high fluences (0.5-8×10 ionscm ) were performed at elevated temperature (≥500°C) in silver layers deposited on various substrates (Si (100), 304 L stainless steel, and pure fused silica). Spherical carbon onions (3-15 nm in diameter) were so produced in the silver layers. A pure carbon onion thin film deposited on the substrate was obtained after annealing in vacuum. Atomic force microscopy and high-resolution transmission electron microscopy experiments were performed to characterize the structure of the thin films. Optical transmittance spectra of carbon onion layers deposited onto silica substrates revealed two absorption peaks centered at 220-230 nm and at 265 nm that were attributed to the presence of carbon onions and residual disordered graphitic carbon, respectively. Tribological experiments performed on silver-carbon onions composite thin films revealed that the friction coefficient is close to that of a pure silver film (0.2) but with much better wear behavior.
langue originaleAnglais
Pages (de - à)1560-1567
Nombre de pages8
journalJournal of Applied Physics
Volume91
Numéro de publication3
Les DOIs
étatPublié - 1 févr. 2002

Empreinte digitale

carbon
silver
thin films
silicon dioxide
coefficient of friction
ion implantation
stainless steels
transmittance
fluence
atomic force microscopy
vacuum
transmission electron microscopy
annealing
composite materials
high resolution
temperature

Citer ceci

Cabioc'h, T., Thune, E., Rivière, J. P., Camelio, S., Girard, J. C., Guérin, P., ... Lambin, P. (2002). Structure and properties of carbon onion layers deposited onto various substrates. Journal of Applied Physics, 91(3), 1560-1567. https://doi.org/10.1063/1.1421222
Cabioc'h, T. ; Thune, E. ; Rivière, J.P. ; Camelio, S. ; Girard, J.C. ; Guérin, P. ; Jaouen, M. ; Henrard, L. ; Lambin, Philippe. / Structure and properties of carbon onion layers deposited onto various substrates. Dans: Journal of Applied Physics. 2002 ; Vol 91, Numéro 3. p. 1560-1567.
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abstract = "120 keV carbon ions implantations at high fluences (0.5-8×10 ionscm ) were performed at elevated temperature (≥500°C) in silver layers deposited on various substrates (Si (100), 304 L stainless steel, and pure fused silica). Spherical carbon onions (3-15 nm in diameter) were so produced in the silver layers. A pure carbon onion thin film deposited on the substrate was obtained after annealing in vacuum. Atomic force microscopy and high-resolution transmission electron microscopy experiments were performed to characterize the structure of the thin films. Optical transmittance spectra of carbon onion layers deposited onto silica substrates revealed two absorption peaks centered at 220-230 nm and at 265 nm that were attributed to the presence of carbon onions and residual disordered graphitic carbon, respectively. Tribological experiments performed on silver-carbon onions composite thin films revealed that the friction coefficient is close to that of a pure silver film (0.2) but with much better wear behavior.",
author = "T. Cabioc'h and E. Thune and J.P. Rivi{\`e}re and S. Camelio and J.C. Girard and P. Gu{\'e}rin and M. Jaouen and L. Henrard and Philippe Lambin",
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Cabioc'h, T, Thune, E, Rivière, JP, Camelio, S, Girard, JC, Guérin, P, Jaouen, M, Henrard, L & Lambin, P 2002, 'Structure and properties of carbon onion layers deposited onto various substrates', Journal of Applied Physics, VOL. 91, Numéro 3, p. 1560-1567. https://doi.org/10.1063/1.1421222

Structure and properties of carbon onion layers deposited onto various substrates. / Cabioc'h, T.; Thune, E.; Rivière, J.P.; Camelio, S.; Girard, J.C.; Guérin, P.; Jaouen, M.; Henrard, L.; Lambin, Philippe.

Dans: Journal of Applied Physics, Vol 91, Numéro 3, 01.02.2002, p. 1560-1567.

Résultats de recherche: Contribution à un journal/une revueArticle

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T1 - Structure and properties of carbon onion layers deposited onto various substrates

AU - Cabioc'h, T.

AU - Thune, E.

AU - Rivière, J.P.

AU - Camelio, S.

AU - Girard, J.C.

AU - Guérin, P.

AU - Jaouen, M.

AU - Henrard, L.

AU - Lambin, Philippe

N1 - Copyright 2012 Elsevier B.V., All rights reserved.

PY - 2002/2/1

Y1 - 2002/2/1

N2 - 120 keV carbon ions implantations at high fluences (0.5-8×10 ionscm ) were performed at elevated temperature (≥500°C) in silver layers deposited on various substrates (Si (100), 304 L stainless steel, and pure fused silica). Spherical carbon onions (3-15 nm in diameter) were so produced in the silver layers. A pure carbon onion thin film deposited on the substrate was obtained after annealing in vacuum. Atomic force microscopy and high-resolution transmission electron microscopy experiments were performed to characterize the structure of the thin films. Optical transmittance spectra of carbon onion layers deposited onto silica substrates revealed two absorption peaks centered at 220-230 nm and at 265 nm that were attributed to the presence of carbon onions and residual disordered graphitic carbon, respectively. Tribological experiments performed on silver-carbon onions composite thin films revealed that the friction coefficient is close to that of a pure silver film (0.2) but with much better wear behavior.

AB - 120 keV carbon ions implantations at high fluences (0.5-8×10 ionscm ) were performed at elevated temperature (≥500°C) in silver layers deposited on various substrates (Si (100), 304 L stainless steel, and pure fused silica). Spherical carbon onions (3-15 nm in diameter) were so produced in the silver layers. A pure carbon onion thin film deposited on the substrate was obtained after annealing in vacuum. Atomic force microscopy and high-resolution transmission electron microscopy experiments were performed to characterize the structure of the thin films. Optical transmittance spectra of carbon onion layers deposited onto silica substrates revealed two absorption peaks centered at 220-230 nm and at 265 nm that were attributed to the presence of carbon onions and residual disordered graphitic carbon, respectively. Tribological experiments performed on silver-carbon onions composite thin films revealed that the friction coefficient is close to that of a pure silver film (0.2) but with much better wear behavior.

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JO - Journal of Applied Physics

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Cabioc'h T, Thune E, Rivière JP, Camelio S, Girard JC, Guérin P et al. Structure and properties of carbon onion layers deposited onto various substrates. Journal of Applied Physics. 2002 févr. 1;91(3):1560-1567. https://doi.org/10.1063/1.1421222