Shelf-life time test of p- and n-channel organic thin film transistors using copper phthalocyanines

S. Nénon, F. Fages, C. Videlot-Ackermann, D. Kanehira, N. Yoshimoto

    Résultats de recherche: Contribution à un journal/une revueArticleRevue par des pairs

    Résumé

    P- and n-type channel thin film transistors (OTFTs) were fabricated by using hexadecahydrogen copper phthalocyanine (HCuPc) and hexadecafluoro copper phthalocyanine (FCuPc) molecules, respectively. Top-contact and bottom-contact source-drain configurations were used for both semiconductors. Furthermore, the temperature and film thickness dependences on the mobility values were measured in the saturation regime of source-drain current. Unipolar mobilities in such single-layer OTFTs were correlated to thin film morphology by X-ray diffraction analysis and atomic force microscopy measurements. Shelf-life time tests of p-type and n-type OTFTs are detailed as OTFT configuration and substrate temperature dependence over a time period of 100 days.
    langue originaleAnglais
    Pages (de - à)5593-5598
    Nombre de pages6
    journalThin Solid Films
    Volume518
    Numéro de publication19
    Les DOIs
    Etat de la publicationPublié - 30 juil. 2010

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