Proliferation of Faulty Materials Data Analysis in the Literature

Matthew R. Linford; Vincent S. Smentkowski; John T. Grant; C. Richard Brundle; Peter M.A. Sherwood; Mark C. Biesinger; Jeff Terry; Kateryna Artyushkova; Alberto Herrera-Gómez; Sven Tougaard; William Skinner; Jean Jacques Pireaux; Christopher F. McConville; Christopher D. Easton; Thomas R. Gengenbach; George H. Major; Paul Dietrich; Andreas Thissen; Mark Engelhard; Cedric J. Powell; Karen J. Gaskell; Donald R. Baer

doi:10.1017/s1431927619015332

Proliferation of Faulty Materials Data Analysis in the Literature

Matthew R. Linford, Vincent S. Smentkowski, John T. Grant, C. Richard Brundle, Peter M.A. Sherwood, Mark C. Biesinger, Jeff Terry, Kateryna Artyushkova, Alberto Herrera-Gómez, Sven Tougaard, William Skinner, Jean Jacques Pireaux, Christopher F. McConville, Christopher D. Easton, Thomas R. Gengenbach, George H. Major, Paul Dietrich, Andreas Thissen, Mark Engelhard, Cedric J. PowellKaren J. Gaskell, Donald R. Baer

Namur Institute of Structured Matter

Résultats de recherche: Contribution à un journal/une revue › Lettre › Revue par des pairs

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langue originale	Anglais
Pages (de - à)	1-2
Nombre de pages	2
journal	Microscopy and Microanalysis
Volume	26
Numéro de publication	1
Les DOIs	https://doi.org/10.1017/s1431927619015332
Etat de la publication	Publié - 15 déc. 2019

Accès au document

10.1017/s1431927619015332

PireauxJJEtAl_Article_2019Accepted author manuscript, 164 KB
proliferation-of-faulty-materials-data-analysis-in-the-literatureVersion finale publiée, 132 KBLicense: CC BY-NC-ND

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Contient cette citation

Linford, M. R., Smentkowski, V. S., Grant, J. T., Brundle, C. R., Sherwood, P. M. A., Biesinger, M. C., Terry, J., Artyushkova, K., Herrera-Gómez, A., Tougaard, S., Skinner, W., Pireaux, J. J., McConville, C. F., Easton, C. D., Gengenbach, T. R., Major, G. H., Dietrich, P., Thissen, A., Engelhard, M., ... Baer, D. R. (2019). Proliferation of Faulty Materials Data Analysis in the Literature. Microscopy and Microanalysis, 26(1), 1-2. https://doi.org/10.1017/s1431927619015332

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title = "Proliferation of Faulty Materials Data Analysis in the Literature",

author = "Linford, {Matthew R.} and Smentkowski, {Vincent S.} and Grant, {John T.} and Brundle, {C. Richard} and Sherwood, {Peter M.A.} and Biesinger, {Mark C.} and Jeff Terry and Kateryna Artyushkova and Alberto Herrera-G{\'o}mez and Sven Tougaard and William Skinner and Pireaux, {Jean Jacques} and McConville, {Christopher F.} and Easton, {Christopher D.} and Gengenbach, {Thomas R.} and Major, {George H.} and Paul Dietrich and Andreas Thissen and Mark Engelhard and Powell, {Cedric J.} and Gaskell, {Karen J.} and Baer, {Donald R.}",

year = "2019",

month = dec,

day = "15",

doi = "10.1017/s1431927619015332",

language = "English",

volume = "26",

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journal = "Microscopy and Microanalysis",

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Linford, MR, Smentkowski, VS, Grant, JT, Brundle, CR, Sherwood, PMA, Biesinger, MC, Terry, J, Artyushkova, K, Herrera-Gómez, A, Tougaard, S, Skinner, W, Pireaux, JJ, McConville, CF, Easton, CD, Gengenbach, TR, Major, GH, Dietrich, P, Thissen, A, Engelhard, M, Powell, CJ, Gaskell, KJ & Baer, DR 2019, 'Proliferation of Faulty Materials Data Analysis in the Literature', Microscopy and Microanalysis, VOL. 26, Numéro 1, p. 1-2. https://doi.org/10.1017/s1431927619015332

TY - JOUR

T1 - Proliferation of Faulty Materials Data Analysis in the Literature

AU - Linford, Matthew R.

AU - Smentkowski, Vincent S.

AU - Grant, John T.

AU - Brundle, C. Richard

AU - Sherwood, Peter M.A.

AU - Biesinger, Mark C.

AU - Terry, Jeff

AU - Artyushkova, Kateryna

AU - Herrera-Gómez, Alberto

AU - Tougaard, Sven

AU - Skinner, William

AU - Pireaux, Jean Jacques

AU - McConville, Christopher F.

AU - Easton, Christopher D.

AU - Gengenbach, Thomas R.

AU - Major, George H.

AU - Dietrich, Paul

AU - Thissen, Andreas

AU - Engelhard, Mark

AU - Powell, Cedric J.

AU - Gaskell, Karen J.

AU - Baer, Donald R.

PY - 2019/12/15

Y1 - 2019/12/15

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U2 - 10.1017/s1431927619015332

DO - 10.1017/s1431927619015332

M3 - Letter

AN - SCOPUS:85078125574

SN - 1431-9276

VL - 26

SP - 1

EP - 2

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

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