Potentialities of the Gelius intensity model in quality control of valence XPS measurements

Joseph Riga; Jean-Pol BOUTIQUE; Jacques Verbist; Joseph Delhalle; Joseph Fripiat

doi:10.1016/0368-2048(84)80022-5

Potentialities of the Gelius intensity model in quality control of valence XPS measurements

Joseph Riga, Jean-Pol BOUTIQUE, Jacques Verbist, Joseph Delhalle, Joseph Fripiat

Résultats de recherche: Contribution à un journal/une revue › Article

Résumé

The Gelius intensity model is shown to be a useful tool to check the quality of XPS valence spectra, in order to be aware of experimental data biased by electrons originating from the sample support.

langue originale	Anglais
Pages (de - à)	263-268
Nombre de pages	6
journal	Journal of Electron Spectroscopy and Related Phenomena
Volume	33
Numéro de publication	3
Les DOIs	https://doi.org/10.1016/0368-2048(84)80022-5
Etat de la publication	Publié - 1984

Accès au document

10.1016/0368-2048(84)80022-5

Contient cette citation

@article{d25b11b3fa9845538eb966b55f640a07,

title = "Potentialities of the Gelius intensity model in quality control of valence XPS measurements",

abstract = "The Gelius intensity model is shown to be a useful tool to check the quality of XPS valence spectra, in order to be aware of experimental data biased by electrons originating from the sample support.",

author = "Joseph Riga and Jean-Pol BOUTIQUE and Jacques Verbist and Joseph Delhalle and Joseph Fripiat",

year = "1984",

doi = "10.1016/0368-2048(84)80022-5",

language = "English",

volume = "33",

pages = "263--268",

journal = "Journal of Electron Spectroscopy and Related Phenomena",

issn = "0368-2048",

publisher = "Elsevier",

number = "3",

}

TY - JOUR

T1 - Potentialities of the Gelius intensity model in quality control of valence XPS measurements

AU - Riga, Joseph

AU - BOUTIQUE, Jean-Pol

AU - Verbist, Jacques

AU - Delhalle, Joseph

AU - Fripiat, Joseph

PY - 1984

Y1 - 1984

N2 - The Gelius intensity model is shown to be a useful tool to check the quality of XPS valence spectra, in order to be aware of experimental data biased by electrons originating from the sample support.

AB - The Gelius intensity model is shown to be a useful tool to check the quality of XPS valence spectra, in order to be aware of experimental data biased by electrons originating from the sample support.

U2 - 10.1016/0368-2048(84)80022-5

DO - 10.1016/0368-2048(84)80022-5

M3 - Article

SN - 0368-2048

VL - 33

SP - 263

EP - 268

JO - Journal of Electron Spectroscopy and Related Phenomena

JF - Journal of Electron Spectroscopy and Related Phenomena

IS - 3

ER -

Potentialities of the Gelius intensity model in quality control of valence XPS measurements

Résumé

Accès au document

Empreinte digitale

Contient cette citation