Poly(dimethyl siloxane) (PDMS) XPS reference core level and energy loss spectra

Pierre Louette; Frédéric Bodino; Jean-Jacques Pireaux

Poly(dimethyl siloxane) (PDMS) XPS reference core level and energy loss spectra

Pierre Louette, Frédéric Bodino, Jean-Jacques Pireaux

Namur Research Institute for Life Sciences

Résultats de recherche: Contribution à un journal/une revue › Article

Résumé

XPS measurements of poly(dimethyl siloxane) (PDMS) recorded with a SSX-100 spectrometer in standardized experimental conditions are presented: survey scan, high resolution core level spectra as well as the energy loss regions of the main elements are analyzed.

langue originale	Anglais
Pages (de - à)	38-43
Nombre de pages	6
journal	Surface science spectra
Volume	12
Etat de la publication	Non publié - 2005

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Contient cette citation

@article{4e5c5fd8ee0444e1acca4c32da5cb1cd,

title = "Poly(dimethyl siloxane) (PDMS) XPS reference core level and energy loss spectra",

abstract = "XPS measurements of poly(dimethyl siloxane) (PDMS) recorded with a SSX-100 spectrometer in standardized experimental conditions are presented: survey scan, high resolution core level spectra as well as the energy loss regions of the main elements are analyzed.",

keywords = " surface, poly, siloxane, PDMS, ESCA, dimethyl, loss, spectroscopy, energy, XPS, core level, x-ray photoelectron",

author = "Pierre Louette and Fr{\'e}d{\'e}ric Bodino and Jean-Jacques Pireaux",

year = "2005",

language = "English",

volume = "12",

pages = "38--43",

journal = "Surface science spectra",

publisher = "AVS Science and Technology Society",

}

TY - JOUR

T1 - Poly(dimethyl siloxane) (PDMS) XPS reference core level and energy loss spectra

AU - Louette, Pierre

AU - Bodino, Frédéric

AU - Pireaux, Jean-Jacques

PY - 2005

Y1 - 2005

N2 - XPS measurements of poly(dimethyl siloxane) (PDMS) recorded with a SSX-100 spectrometer in standardized experimental conditions are presented: survey scan, high resolution core level spectra as well as the energy loss regions of the main elements are analyzed.

AB - XPS measurements of poly(dimethyl siloxane) (PDMS) recorded with a SSX-100 spectrometer in standardized experimental conditions are presented: survey scan, high resolution core level spectra as well as the energy loss regions of the main elements are analyzed.

KW - surface

KW - poly

KW - siloxane

KW - PDMS

KW - ESCA

KW - dimethyl

KW - loss

KW - spectroscopy

KW - energy

KW - XPS

KW - core level

KW - x-ray photoelectron

M3 - Article

VL - 12

SP - 38

EP - 43

JO - Surface science spectra

JF - Surface science spectra

ER -

Poly(dimethyl siloxane) (PDMS) XPS reference core level and energy loss spectra

Résumé

Équipement

Synthèse, Irradiation et Analyse de Matériaux (SIAM) (2016 - ...)

Contient cette citation