Plasma functionalization of AFM tips for measurement of chemical interactions

C. Volcke, R.P. Gandhiraman, V. Gubala, C. Doyle, G. Fonder, P.A. Thiry, A.A. Cafolla, B. James, D.E. Williams

    Résultats de recherche: Contribution à un journal/une revueArticleRevue par des pairs

    Résumé

    In this paper, a new, fast, reproducible technique for atomic force microscopy (AFM) tips functionalization used for chemical interaction measurements is described. Precisely, the deposition of an aminated precursor is performed through plasma-enhanced chemical vapor deposition (PECVD) in order to create amine functional groups on the AFM tip and cantilever. The advantages of the precursor, aminopropyltriethoxysilane (APTES), were recently demonstrated for amine layer formation through PECVD deposition on polymeric surfaces. We extended this procedure to functionalize AFM probes. Titration force spectroscopy highlights the successful functionalization of AFM tips as well as their stability and use under different environmental conditions.
    langue originaleAnglais
    Pages (de - à)322-328
    Nombre de pages7
    journalJournal of Colloid and Interface Science
    Volume348
    Numéro de publication2
    Les DOIs
    Etat de la publicationPublié - 1 août 2010

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