Plasma functionalization of AFM tips for measurement of chemical interactions

C. Volcke, R.P. Gandhiraman, V. Gubala, C. Doyle, G. Fonder, P.A. Thiry, A.A. Cafolla, B. James, D.E. Williams

Résultats de recherche: Contribution à un journal/une revueArticle

Résumé

In this paper, a new, fast, reproducible technique for atomic force microscopy (AFM) tips functionalization used for chemical interaction measurements is described. Precisely, the deposition of an aminated precursor is performed through plasma-enhanced chemical vapor deposition (PECVD) in order to create amine functional groups on the AFM tip and cantilever. The advantages of the precursor, aminopropyltriethoxysilane (APTES), were recently demonstrated for amine layer formation through PECVD deposition on polymeric surfaces. We extended this procedure to functionalize AFM probes. Titration force spectroscopy highlights the successful functionalization of AFM tips as well as their stability and use under different environmental conditions.
langue originaleAnglais
Pages (de - à)322-328
Nombre de pages7
journalJournal of Colloid and Interface Science
Volume348
Numéro de publication2
Les DOIs
étatPublié - 1 août 2010

Empreinte digitale

Atomic force microscopy
Plasmas
Plasma enhanced chemical vapor deposition
Amines
Titration
Functional groups
Spectroscopy

Citer ceci

Volcke, C. ; Gandhiraman, R.P. ; Gubala, V. ; Doyle, C. ; Fonder, G. ; Thiry, P.A. ; Cafolla, A.A. ; James, B. ; Williams, D.E. / Plasma functionalization of AFM tips for measurement of chemical interactions. Dans: Journal of Colloid and Interface Science. 2010 ; Vol 348, Numéro 2. p. 322-328.
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Plasma functionalization of AFM tips for measurement of chemical interactions. / Volcke, C.; Gandhiraman, R.P.; Gubala, V.; Doyle, C.; Fonder, G.; Thiry, P.A.; Cafolla, A.A.; James, B.; Williams, D.E.

Dans: Journal of Colloid and Interface Science, Vol 348, Numéro 2, 01.08.2010, p. 322-328.

Résultats de recherche: Contribution à un journal/une revueArticle

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