Oxygen loss induced by swift heavy ions of low and high dE/dx in PMMA thin films

R. Thomaz, L. I. Gutierres, J. Morais, Pierre Louette, D. Severin, C. Trautmann, Jean-Jacques Pireaux, R. M. Papaléo

Résultats de recherche: Contribution à un journal/une revueArticle

Résumé

Investigations on the chemical modifications induced by swift heavy ions in PMMA thin films were carried out using beams of high dE/dx (2.2 GeV Bi, 14,090 eV/nm) and low dE/dx (2 MeV H, 19 eV/nm). The induced chemical modifications were monitored by XPS for films with initial thickness of 50 and 100 nm. For both beams, the irradiation decreased the amount of carbon atoms bound to oxygen (C=O and C-O-C), with a larger decrease of the carboxyl moiety, as expected. However, the chemical changes induced by light and heavy ions were qualitatively different. For the same mean deposited energy density, proton irradiation induced a decrease of the relative intensity of the carbon-oxygen bonds up to ∼20% larger than the irradiation with Bi ions. This suggests a greater importance of particle ejection by unzipping of PMMA chains at high dE/dx, which tends to keep the O/C ratio closer to the pristine value.

langue originaleAnglais
Pages (de - à)578-582
Nombre de pages5
journalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume365
Les DOIs
étatPublié - 15 déc. 2015

Empreinte digitale

Chemical modification
Heavy ions
heavy ions
Irradiation
Proton irradiation
Thin films
Carbon
Oxygen
oxygen
thin films
irradiation
proton irradiation
X ray photoelectron spectroscopy
light ions
carbon
ejection
Atoms
Ions
flux density
atoms

Citer ceci

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title = "Oxygen loss induced by swift heavy ions of low and high dE/dx in PMMA thin films",
abstract = "Investigations on the chemical modifications induced by swift heavy ions in PMMA thin films were carried out using beams of high dE/dx (2.2 GeV Bi, 14,090 eV/nm) and low dE/dx (2 MeV H, 19 eV/nm). The induced chemical modifications were monitored by XPS for films with initial thickness of 50 and 100 nm. For both beams, the irradiation decreased the amount of carbon atoms bound to oxygen (C=O and C-O-C), with a larger decrease of the carboxyl moiety, as expected. However, the chemical changes induced by light and heavy ions were qualitatively different. For the same mean deposited energy density, proton irradiation induced a decrease of the relative intensity of the carbon-oxygen bonds up to ∼20{\%} larger than the irradiation with Bi ions. This suggests a greater importance of particle ejection by unzipping of PMMA chains at high dE/dx, which tends to keep the O/C ratio closer to the pristine value.",
keywords = "Chemical modifications, Depolymerization, Ion irradiation, Polymer thin films",
author = "R. Thomaz and Gutierres, {L. I.} and J. Morais and Pierre Louette and D. Severin and C. Trautmann and Jean-Jacques Pireaux and Papal{\'e}o, {R. M.}",
year = "2015",
month = "12",
day = "15",
doi = "10.1016/j.nimb.2015.09.019",
language = "English",
volume = "365",
pages = "578--582",
journal = "Nuclear Instruments and Methods in Physical Research B",
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Oxygen loss induced by swift heavy ions of low and high dE/dx in PMMA thin films. / Thomaz, R.; Gutierres, L. I.; Morais, J.; Louette, Pierre; Severin, D.; Trautmann, C.; Pireaux, Jean-Jacques; Papaléo, R. M.

Dans: Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, Vol 365, 15.12.2015, p. 578-582.

Résultats de recherche: Contribution à un journal/une revueArticle

TY - JOUR

T1 - Oxygen loss induced by swift heavy ions of low and high dE/dx in PMMA thin films

AU - Thomaz, R.

AU - Gutierres, L. I.

AU - Morais, J.

AU - Louette, Pierre

AU - Severin, D.

AU - Trautmann, C.

AU - Pireaux, Jean-Jacques

AU - Papaléo, R. M.

PY - 2015/12/15

Y1 - 2015/12/15

N2 - Investigations on the chemical modifications induced by swift heavy ions in PMMA thin films were carried out using beams of high dE/dx (2.2 GeV Bi, 14,090 eV/nm) and low dE/dx (2 MeV H, 19 eV/nm). The induced chemical modifications were monitored by XPS for films with initial thickness of 50 and 100 nm. For both beams, the irradiation decreased the amount of carbon atoms bound to oxygen (C=O and C-O-C), with a larger decrease of the carboxyl moiety, as expected. However, the chemical changes induced by light and heavy ions were qualitatively different. For the same mean deposited energy density, proton irradiation induced a decrease of the relative intensity of the carbon-oxygen bonds up to ∼20% larger than the irradiation with Bi ions. This suggests a greater importance of particle ejection by unzipping of PMMA chains at high dE/dx, which tends to keep the O/C ratio closer to the pristine value.

AB - Investigations on the chemical modifications induced by swift heavy ions in PMMA thin films were carried out using beams of high dE/dx (2.2 GeV Bi, 14,090 eV/nm) and low dE/dx (2 MeV H, 19 eV/nm). The induced chemical modifications were monitored by XPS for films with initial thickness of 50 and 100 nm. For both beams, the irradiation decreased the amount of carbon atoms bound to oxygen (C=O and C-O-C), with a larger decrease of the carboxyl moiety, as expected. However, the chemical changes induced by light and heavy ions were qualitatively different. For the same mean deposited energy density, proton irradiation induced a decrease of the relative intensity of the carbon-oxygen bonds up to ∼20% larger than the irradiation with Bi ions. This suggests a greater importance of particle ejection by unzipping of PMMA chains at high dE/dx, which tends to keep the O/C ratio closer to the pristine value.

KW - Chemical modifications

KW - Depolymerization

KW - Ion irradiation

KW - Polymer thin films

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DO - 10.1016/j.nimb.2015.09.019

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