Nylon 6,6 (N66) XPS reference core level and energy loss spectra.

Pierre Louette; Frédéric Bodino; Jean-Jacques Pireaux

doi:10.1116/11.20050903

Nylon 6,6 (N66) XPS reference core level and energy loss spectra.

Pierre Louette, Frédéric Bodino, Jean-Jacques Pireaux

Namur Research Institute for Life Sciences

Résultats de recherche: Contribution à un journal/une revue › Article

Résumé

XPS measurements of Nylon 6,6 (N66) recorded with a SSX-100 spectrometer in standardized experimental conditions are presented: survey scan, high resolution core level spectra as well as the energy loss regions of the main elements are analyzed.

langue originale	Anglais
Pages (de - à)	6-11
Nombre de pages	6
journal	Surface science spectra
Volume	12
Les DOIs	https://doi.org/10.1116/11.20050903
Etat de la publication	Publié - 2005

Accès au document

10.1116/11.20050903

Autres fichiers et liens

http://adsabs.harvard.edu/abs/2005SurSS..12...12L

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Plateforme technologique Synthese, irradiation et analyse des materiaux
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Contient cette citation

@article{241e719eefcb48868dd2d0400cfc4c62,

title = "Nylon 6,6 (N66) XPS reference core level and energy loss spectra.",

abstract = "XPS measurements of Nylon 6,6 (N66) recorded with a SSX-100 spectrometer in standardized experimental conditions are presented: survey scan, high resolution core level spectra as well as the energy loss regions of the main elements are analyzed.",

keywords = " surface, N66, loss, spectroscopy, energy, XPS, Nylon, core level, x-ray photoelectron",

author = "Pierre Louette and Fr{\'e}d{\'e}ric Bodino and Jean-Jacques Pireaux",

year = "2005",

doi = "10.1116/11.20050903",

language = "English",

volume = "12",

pages = "6--11",

journal = "Surface science spectra",

publisher = "AVS Science and Technology Society",

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TY - JOUR

T1 - Nylon 6,6 (N66) XPS reference core level and energy loss spectra.

AU - Louette, Pierre

AU - Bodino, Frédéric

AU - Pireaux, Jean-Jacques

PY - 2005

Y1 - 2005

N2 - XPS measurements of Nylon 6,6 (N66) recorded with a SSX-100 spectrometer in standardized experimental conditions are presented: survey scan, high resolution core level spectra as well as the energy loss regions of the main elements are analyzed.

AB - XPS measurements of Nylon 6,6 (N66) recorded with a SSX-100 spectrometer in standardized experimental conditions are presented: survey scan, high resolution core level spectra as well as the energy loss regions of the main elements are analyzed.

KW - surface

KW - N66

KW - loss

KW - spectroscopy

KW - energy

KW - XPS

KW - Nylon

KW - core level

KW - x-ray photoelectron

UR - http://adsabs.harvard.edu/abs/2005SurSS..12...12L

U2 - 10.1116/11.20050903

DO - 10.1116/11.20050903

M3 - Article

VL - 12

SP - 6

EP - 11

JO - Surface science spectra

JF - Surface science spectra

ER -

Nylon 6,6 (N66) XPS reference core level and energy loss spectra.

Résumé

Accès au document

Autres fichiers et liens

Empreinte digitale

Équipement

Synthèse, Irradiation et Analyse de Matériaux (SIAM) (2016 - ...)

Contient cette citation