TY - JOUR
T1 - Nitrogen redistribution in annealed LaFeOxNy thin films investigated by FTIR spectroscopy and EELS mapping
AU - Haye, Emile
AU - Pierron, Victor
AU - Barrat, Silvère
AU - Capon, Fabien
AU - Munnik, Frans
AU - Bruyère, Stéphanie
PY - 2018/1/1
Y1 - 2018/1/1
N2 - LaFeOxNy thin films have been deposited by magnetron sputtering in Ar/O2/N2 gas mixture at 800 °C. Such oxynitride perovskites present a specific infrared vibration mode at 2040 cm−1, due to the presence of nitrogen, which disappears during heating in air. The loss of the vibration mode with temperature has been monitored allowing the determination of an activation energy of thermal degradation of LaFeOxNy. The quantification of nitrogen by Elastic Recoil Detection Analysis (ERDA) before and after heating exhibits the same nitrogen content. Such behavior is due to a nitrogen redistribution observed by Electron Energy Loss Spectroscopy (EELS) mapping, showing migration of nitrogen into grain boundaries, in association with the film oxidation.
AB - LaFeOxNy thin films have been deposited by magnetron sputtering in Ar/O2/N2 gas mixture at 800 °C. Such oxynitride perovskites present a specific infrared vibration mode at 2040 cm−1, due to the presence of nitrogen, which disappears during heating in air. The loss of the vibration mode with temperature has been monitored allowing the determination of an activation energy of thermal degradation of LaFeOxNy. The quantification of nitrogen by Elastic Recoil Detection Analysis (ERDA) before and after heating exhibits the same nitrogen content. Such behavior is due to a nitrogen redistribution observed by Electron Energy Loss Spectroscopy (EELS) mapping, showing migration of nitrogen into grain boundaries, in association with the film oxidation.
KW - EELS mapping
KW - FTIR
KW - Oxynitride perovskite
KW - Thermal stability
UR - http://www.scopus.com/inward/record.url?scp=85029497466&partnerID=8YFLogxK
U2 - 10.1016/j.apsusc.2017.09.090
DO - 10.1016/j.apsusc.2017.09.090
M3 - Article
AN - SCOPUS:85029497466
SN - 0169-4332
VL - 427
SP - 1041
EP - 1045
JO - Applied Surface Science
JF - Applied Surface Science
ER -