Nitrogen redistribution in annealed LaFeOxNy thin films investigated by FTIR spectroscopy and EELS mapping

Emile Haye, Victor Pierron, Silvère Barrat, Fabien Capon, Frans Munnik, Stéphanie Bruyère

Résultats de recherche: Recherche - Revue par des pairsArticle

Résumé

LaFeOxNy thin films have been deposited by magnetron sputtering in Ar/O2/N2 gas mixture at 800 °C. Such oxynitride perovskites present a specific infrared vibration mode at 2040 cm−1, due to the presence of nitrogen, which disappears during heating in air. The loss of the vibration mode with temperature has been monitored allowing the determination of an activation energy of thermal degradation of LaFeOxNy. The quantification of nitrogen by Elastic Recoil Detection Analysis (ERDA) before and after heating exhibits the same nitrogen content. Such behavior is due to a nitrogen redistribution observed by Electron Energy Loss Spectroscopy (EELS) mapping, showing migration of nitrogen into grain boundaries, in association with the film oxidation.

langueAnglais
Pages1041-1045
Nombre de pages5
journalApplied Surface Science
Volume427
Les DOIs
étatPublié - 1 janv. 2018

Empreinte digitale

Electron energy loss spectroscopy
Nitrogen
Spectroscopy
Thin films
Heating
Gas mixtures
Magnetron sputtering
Grain boundaries
Pyrolysis
Activation energy
Association reactions
Infrared radiation
Oxidation
Air
Temperature

mots-clés

    Citer ceci

    Haye, Emile ; Pierron, Victor ; Barrat, Silvère ; Capon, Fabien ; Munnik, Frans ; Bruyère, Stéphanie. / Nitrogen redistribution in annealed LaFeOxNy thin films investigated by FTIR spectroscopy and EELS mapping. Dans: Applied Surface Science. 2018 ; Vol 427. p. 1041-1045
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    abstract = "LaFeOxNy thin films have been deposited by magnetron sputtering in Ar/O2/N2 gas mixture at 800 °C. Such oxynitride perovskites present a specific infrared vibration mode at 2040 cm−1, due to the presence of nitrogen, which disappears during heating in air. The loss of the vibration mode with temperature has been monitored allowing the determination of an activation energy of thermal degradation of LaFeOxNy. The quantification of nitrogen by Elastic Recoil Detection Analysis (ERDA) before and after heating exhibits the same nitrogen content. Such behavior is due to a nitrogen redistribution observed by Electron Energy Loss Spectroscopy (EELS) mapping, showing migration of nitrogen into grain boundaries, in association with the film oxidation.",
    keywords = "EELS mapping, FTIR, Oxynitride perovskite, Thermal stability",
    author = "Emile Haye and Victor Pierron and Silvère Barrat and Fabien Capon and Frans Munnik and Stéphanie Bruyère",
    year = "2018",
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    Nitrogen redistribution in annealed LaFeOxNy thin films investigated by FTIR spectroscopy and EELS mapping. / Haye, Emile; Pierron, Victor; Barrat, Silvère; Capon, Fabien; Munnik, Frans; Bruyère, Stéphanie.

    Dans: Applied Surface Science, Vol 427, 01.01.2018, p. 1041-1045.

    Résultats de recherche: Recherche - Revue par des pairsArticle

    TY - JOUR

    T1 - Nitrogen redistribution in annealed LaFeOxNy thin films investigated by FTIR spectroscopy and EELS mapping

    AU - Haye,Emile

    AU - Pierron,Victor

    AU - Barrat,Silvère

    AU - Capon,Fabien

    AU - Munnik,Frans

    AU - Bruyère,Stéphanie

    PY - 2018/1/1

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    AB - LaFeOxNy thin films have been deposited by magnetron sputtering in Ar/O2/N2 gas mixture at 800 °C. Such oxynitride perovskites present a specific infrared vibration mode at 2040 cm−1, due to the presence of nitrogen, which disappears during heating in air. The loss of the vibration mode with temperature has been monitored allowing the determination of an activation energy of thermal degradation of LaFeOxNy. The quantification of nitrogen by Elastic Recoil Detection Analysis (ERDA) before and after heating exhibits the same nitrogen content. Such behavior is due to a nitrogen redistribution observed by Electron Energy Loss Spectroscopy (EELS) mapping, showing migration of nitrogen into grain boundaries, in association with the film oxidation.

    KW - EELS mapping

    KW - FTIR

    KW - Oxynitride perovskite

    KW - Thermal stability

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