Nitrogen redistribution in annealed LaFeOxNy thin films investigated by FTIR spectroscopy and EELS mapping

Emile Haye, Victor Pierron, Silvère Barrat, Fabien Capon, Frans Munnik, Stéphanie Bruyère

Résultats de recherche: Contribution à un journal/une revueArticleRevue par des pairs

Résumé

LaFeOxNy thin films have been deposited by magnetron sputtering in Ar/O2/N2 gas mixture at 800 °C. Such oxynitride perovskites present a specific infrared vibration mode at 2040 cm−1, due to the presence of nitrogen, which disappears during heating in air. The loss of the vibration mode with temperature has been monitored allowing the determination of an activation energy of thermal degradation of LaFeOxNy. The quantification of nitrogen by Elastic Recoil Detection Analysis (ERDA) before and after heating exhibits the same nitrogen content. Such behavior is due to a nitrogen redistribution observed by Electron Energy Loss Spectroscopy (EELS) mapping, showing migration of nitrogen into grain boundaries, in association with the film oxidation.

langue originaleAnglais
Pages (de - à)1041-1045
Nombre de pages5
journalApplied Surface Science
Volume427
Les DOIs
Etat de la publicationPublié - 1 janv. 2018

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