Measuring point defect density in individual carbon nanotubes using polarization-dependent X-ray microscopy

A. Felten, X. Gillon, M. Gulas, J.-J. Pireaux, X. Ke, G. Van Tendeloo, C. Bittencourt, E. Najafi, A.P. Hitchcock

Résultats de recherche: Contribution à un journal/une revueArticle

Résumé

The presence of defects in carbon nanotubes strongly modifies their electrical, mechanical, and chemical properties. It was long thought undesirable, but recent experiments have shown that introduction of structural defects using ion or electron irradiation can lead to novel nanodevices. We demonstrate a method for detecting and quantifying point defect density in individual carbon nanotubes (CNTs) based on measuring the polarization dependence (linear dichroism) of the C 1s → π* transition at specific locations along individual CNTs with a scanning transmission X-ray microscope (STXM). We show that STXM can be used to probe defect density in individual CNTs with high spatial resolution. The quantitative relationship between ion dose, nanotube diameter, and defect density was explored by purposely irradiating selected sections of nanotubes with kiloelectronvolt (keV) Ga ions. Our results establish polarization-dependent X-ray microscopy as a new and very powerful characterization technique for carbon nanotubes and other anisotropic nanostructures.
langue originaleAnglais
Pages (de - à)4431-4436
Nombre de pages6
journalACS nano
Volume4
Numéro de publication8
Les DOIs
étatPublié - 24 août 2010

Empreinte digitale

Carbon Nanotubes
Defect density
Point defects
point defects
Carbon nanotubes
Microscopic examination
carbon nanotubes
Polarization
microscopy
X rays
X ray microscopes
polarization
defects
x rays
Nanotubes
nanotubes
microscopes
Ions
Scanning
Defects

Citer ceci

Felten, A. ; Gillon, X. ; Gulas, M. ; Pireaux, J.-J. ; Ke, X. ; Van Tendeloo, G. ; Bittencourt, C. ; Najafi, E. ; Hitchcock, A.P. / Measuring point defect density in individual carbon nanotubes using polarization-dependent X-ray microscopy. Dans: ACS nano. 2010 ; Vol 4, Numéro 8. p. 4431-4436.
@article{1683d8f124e34a1b9ba082a1350c94e7,
title = "Measuring point defect density in individual carbon nanotubes using polarization-dependent X-ray microscopy",
abstract = "The presence of defects in carbon nanotubes strongly modifies their electrical, mechanical, and chemical properties. It was long thought undesirable, but recent experiments have shown that introduction of structural defects using ion or electron irradiation can lead to novel nanodevices. We demonstrate a method for detecting and quantifying point defect density in individual carbon nanotubes (CNTs) based on measuring the polarization dependence (linear dichroism) of the C 1s → π* transition at specific locations along individual CNTs with a scanning transmission X-ray microscope (STXM). We show that STXM can be used to probe defect density in individual CNTs with high spatial resolution. The quantitative relationship between ion dose, nanotube diameter, and defect density was explored by purposely irradiating selected sections of nanotubes with kiloelectronvolt (keV) Ga ions. Our results establish polarization-dependent X-ray microscopy as a new and very powerful characterization technique for carbon nanotubes and other anisotropic nanostructures.",
author = "A. Felten and X. Gillon and M. Gulas and J.-J. Pireaux and X. Ke and {Van Tendeloo}, G. and C. Bittencourt and E. Najafi and A.P. Hitchcock",
year = "2010",
month = "8",
day = "24",
doi = "10.1021/nn1002248",
language = "English",
volume = "4",
pages = "4431--4436",
journal = "ACS nano",
issn = "1936-0851",
publisher = "American Chemical Society",
number = "8",

}

Measuring point defect density in individual carbon nanotubes using polarization-dependent X-ray microscopy. / Felten, A.; Gillon, X.; Gulas, M.; Pireaux, J.-J.; Ke, X.; Van Tendeloo, G.; Bittencourt, C.; Najafi, E.; Hitchcock, A.P.

Dans: ACS nano, Vol 4, Numéro 8, 24.08.2010, p. 4431-4436.

Résultats de recherche: Contribution à un journal/une revueArticle

TY - JOUR

T1 - Measuring point defect density in individual carbon nanotubes using polarization-dependent X-ray microscopy

AU - Felten, A.

AU - Gillon, X.

AU - Gulas, M.

AU - Pireaux, J.-J.

AU - Ke, X.

AU - Van Tendeloo, G.

AU - Bittencourt, C.

AU - Najafi, E.

AU - Hitchcock, A.P.

PY - 2010/8/24

Y1 - 2010/8/24

N2 - The presence of defects in carbon nanotubes strongly modifies their electrical, mechanical, and chemical properties. It was long thought undesirable, but recent experiments have shown that introduction of structural defects using ion or electron irradiation can lead to novel nanodevices. We demonstrate a method for detecting and quantifying point defect density in individual carbon nanotubes (CNTs) based on measuring the polarization dependence (linear dichroism) of the C 1s → π* transition at specific locations along individual CNTs with a scanning transmission X-ray microscope (STXM). We show that STXM can be used to probe defect density in individual CNTs with high spatial resolution. The quantitative relationship between ion dose, nanotube diameter, and defect density was explored by purposely irradiating selected sections of nanotubes with kiloelectronvolt (keV) Ga ions. Our results establish polarization-dependent X-ray microscopy as a new and very powerful characterization technique for carbon nanotubes and other anisotropic nanostructures.

AB - The presence of defects in carbon nanotubes strongly modifies their electrical, mechanical, and chemical properties. It was long thought undesirable, but recent experiments have shown that introduction of structural defects using ion or electron irradiation can lead to novel nanodevices. We demonstrate a method for detecting and quantifying point defect density in individual carbon nanotubes (CNTs) based on measuring the polarization dependence (linear dichroism) of the C 1s → π* transition at specific locations along individual CNTs with a scanning transmission X-ray microscope (STXM). We show that STXM can be used to probe defect density in individual CNTs with high spatial resolution. The quantitative relationship between ion dose, nanotube diameter, and defect density was explored by purposely irradiating selected sections of nanotubes with kiloelectronvolt (keV) Ga ions. Our results establish polarization-dependent X-ray microscopy as a new and very powerful characterization technique for carbon nanotubes and other anisotropic nanostructures.

UR - http://www.scopus.com/inward/record.url?scp=78650154871&partnerID=8YFLogxK

U2 - 10.1021/nn1002248

DO - 10.1021/nn1002248

M3 - Article

VL - 4

SP - 4431

EP - 4436

JO - ACS nano

JF - ACS nano

SN - 1936-0851

IS - 8

ER -