Java Unit Testing Tool Competition - Seventh Round

Fitsum Kifetew, Xavier Devroey, Urko Rueda

Résultats de recherche: Contribution dans un livre/un catalogue/un rapport/dans les actes d'une conférenceArticle dans les actes d'une conférence/un colloque

Résumé

We report on the results of the seventh edition of the JUnit tool competition. This year, four tools were executed on a benchmark with (i) new classes, selected from real-world software projects, and (ii) challenging classes from the previous edition. We use Randoop and manual test suites from the projects as baselines. Given the interesting findings of last year, we analyzed the effectiveness of the combined test suites generated by all competing tools and compared; results are confronted with the manual test suites of the projects, as well as those generated by the competing tools. This paper describes our methodology and the results, highlight challenges faced during the contest.

langue originaleAnglais
titreProceedings - 2019 IEEE/ACM 12th International Workshop on Search-Based Software Testing, SBST 2019
EditeurInstitute of Electrical and Electronics Engineers Inc.
Pages15-20
Nombre de pages6
ISBN (Electronique)9781728122335
Les DOIs
étatPublié - 1 mai 2019
Modification externeOui
Evénement12th IEEE/ACM International Workshop on Search-Based Software Testing, SBST 2019 - Montreal, Canada
Durée: 27 mai 2019 → …

Série de publications

NomProceedings - 2019 IEEE/ACM 12th International Workshop on Search-Based Software Testing, SBST 2019

Une conférence

Une conférence12th IEEE/ACM International Workshop on Search-Based Software Testing, SBST 2019
PaysCanada
La villeMontreal
période27/05/19 → …

    Empreinte digitale

Contient cette citation

Kifetew, F., Devroey, X., & Rueda, U. (2019). Java Unit Testing Tool Competition - Seventh Round. Dans Proceedings - 2019 IEEE/ACM 12th International Workshop on Search-Based Software Testing, SBST 2019 (p. 15-20). [8812209] (Proceedings - 2019 IEEE/ACM 12th International Workshop on Search-Based Software Testing, SBST 2019). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/SBST.2019.00014