Investigation of the atomic interdiffusion and phase formation in ion beam irradiated thin Al-Cu and Al-Ag multilayers by in-situ RBS and XRD

Andreas Markwitz; W. Matz; M. Waldschmidt; Guy Demortier

Investigation of the atomic interdiffusion and phase formation in ion beam irradiated thin Al-Cu and Al-Ag multilayers by in-situ RBS and XRD

Andreas Markwitz, W. Matz, M. Waldschmidt, Guy Demortier

Résultats de recherche: Contribution à un journal/une revue › Article

langue originale	Anglais
Pages (de - à)	160-174
Nombre de pages	15
journal	Surface and interface analysis
Volume	26
Etat de la publication	Publié - 1998

Contient cette citation

@article{57f69eb8065d46e48dcf32aea66fb50b,

title = "Investigation of the atomic interdiffusion and phase formation in ion beam irradiated thin Al-Cu and Al-Ag multilayers by in-situ RBS and XRD",

author = "Andreas Markwitz and W. Matz and M. Waldschmidt and Guy Demortier",

year = "1998",

language = "English",

volume = "26",

pages = "160--174",

journal = "Surface and interface analysis",

publisher = "John Wiley and Sons Ltd",

}

TY - JOUR

T1 - Investigation of the atomic interdiffusion and phase formation in ion beam irradiated thin Al-Cu and Al-Ag multilayers by in-situ RBS and XRD

AU - Markwitz, Andreas

AU - Matz, W.

AU - Waldschmidt, M.

AU - Demortier, Guy

PY - 1998

Y1 - 1998

M3 - Article

VL - 26

SP - 160

EP - 174

JO - Surface and interface analysis

JF - Surface and interface analysis

ER -