Investigation of Doppler Broadening of compton line by PIXE

V.E. Nuttens, R.L. Hubert, F. Bodart, S. Lucas

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We have investigated the possibility to highlight the Compton broadening effect using proton-induced X-ray emission. A special configuration of the irradiated sample has been chosen: a very thin rhodium layer deposited on a glassy carbon substrate. The X-rays photons are generated in the thin layer of rhodium owing to the ionisation by the proton irradiation. The substrate is in glassy carbon to prevent it to fluoresce. The PIXE results are compared with Monte-Carlo simulation (MCNPX) and with the theoretical model of DuMond et al. A very good agreement is observed. © 2005 Elsevier B.V. All rights reserved.
langue originaleAnglais
Pages (de - à)293-296
Nombre de pages4
journalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Numéro de publication1-2
Les DOIs
Etat de la publicationPublié - 2005

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