Investigation of Doppler Broadening of compton line by PIXE

V.E. Nuttens; R.L. Hubert; F. Bodart; S. Lucas

doi:10.1016/j.nimb.2005.06.132

Investigation of Doppler Broadening of compton line by PIXE

V.E. Nuttens, R.L. Hubert, F. Bodart, S. Lucas

Namur Research Institute for Life Sciences

Résultats de recherche: Contribution à un journal/une revue › Article › Revue par des pairs

Résumé

We have investigated the possibility to highlight the Compton broadening effect using proton-induced X-ray emission. A special configuration of the irradiated sample has been chosen: a very thin rhodium layer deposited on a glassy carbon substrate. The X-rays photons are generated in the thin layer of rhodium owing to the ionisation by the proton irradiation. The substrate is in glassy carbon to prevent it to fluoresce. The PIXE results are compared with Monte-Carlo simulation (MCNPX) and with the theoretical model of DuMond et al. A very good agreement is observed. © 2005 Elsevier B.V. All rights reserved.

langue originale	Anglais
Pages (de - à)	293-296
Nombre de pages	4
journal	Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume	240
Numéro de publication	1-2
Les DOIs	https://doi.org/10.1016/j.nimb.2005.06.132
Etat de la publication	Publié - 2005

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10.1016/j.nimb.2005.06.132

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@article{a5d3e47f01994dd4a7ffa03a88c81750,

title = "Investigation of Doppler Broadening of compton line by PIXE",

abstract = "We have investigated the possibility to highlight the Compton broadening effect using proton-induced X-ray emission. A special configuration of the irradiated sample has been chosen: a very thin rhodium layer deposited on a glassy carbon substrate. The X-rays photons are generated in the thin layer of rhodium owing to the ionisation by the proton irradiation. The substrate is in glassy carbon to prevent it to fluoresce. The PIXE results are compared with Monte-Carlo simulation (MCNPX) and with the theoretical model of DuMond et al. A very good agreement is observed. {\textcopyright} 2005 Elsevier B.V. All rights reserved.",

keywords = "Doppler broadening, Monte-Carlo simulations, PIXE",

author = "V.E. Nuttens and R.L. Hubert and F. Bodart and S. Lucas",

note = "Publication code : **RES. ACAD.",

year = "2005",

doi = "10.1016/j.nimb.2005.06.132",

language = "English",

volume = "240",

pages = "293--296",

journal = "Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms",

issn = "0168-583X",

publisher = "Elsevier",

number = "1-2",

}

TY - JOUR

T1 - Investigation of Doppler Broadening of compton line by PIXE

AU - Nuttens, V.E.

AU - Hubert, R.L.

AU - Bodart, F.

AU - Lucas, S.

N1 - Publication code : **RES. ACAD.

PY - 2005

Y1 - 2005

N2 - We have investigated the possibility to highlight the Compton broadening effect using proton-induced X-ray emission. A special configuration of the irradiated sample has been chosen: a very thin rhodium layer deposited on a glassy carbon substrate. The X-rays photons are generated in the thin layer of rhodium owing to the ionisation by the proton irradiation. The substrate is in glassy carbon to prevent it to fluoresce. The PIXE results are compared with Monte-Carlo simulation (MCNPX) and with the theoretical model of DuMond et al. A very good agreement is observed. © 2005 Elsevier B.V. All rights reserved.

AB - We have investigated the possibility to highlight the Compton broadening effect using proton-induced X-ray emission. A special configuration of the irradiated sample has been chosen: a very thin rhodium layer deposited on a glassy carbon substrate. The X-rays photons are generated in the thin layer of rhodium owing to the ionisation by the proton irradiation. The substrate is in glassy carbon to prevent it to fluoresce. The PIXE results are compared with Monte-Carlo simulation (MCNPX) and with the theoretical model of DuMond et al. A very good agreement is observed. © 2005 Elsevier B.V. All rights reserved.

KW - Doppler broadening

KW - Monte-Carlo simulations

KW - PIXE

UR - http://www.scopus.com/inward/record.url?scp=27444435188&partnerID=8YFLogxK

U2 - 10.1016/j.nimb.2005.06.132

DO - 10.1016/j.nimb.2005.06.132

M3 - Article

SN - 0168-583X

VL - 240

SP - 293

EP - 296

JO - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

JF - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

IS - 1-2

ER -

Investigation of Doppler Broadening of compton line by PIXE

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