Inverse photoemission spectroscopy of electron irradiated epitaxial CaF2 on Si(111)

Saidi Bouzidi; Thierry ANGOT; Véronique LANGLAIS; Jean-Marie DEBEVER; Robert Sporken; Jean-Louis Longueville; Paul Thiry

Inverse photoemission spectroscopy of electron irradiated epitaxial CaF2 on Si(111)

Saidi Bouzidi, Thierry ANGOT, Véronique LANGLAIS, Jean-Marie DEBEVER, Robert Sporken, Jean-Louis Longueville, Paul Thiry

Résultats de recherche: Contribution à un journal/une revue › Article

langue originale	Anglais
Pages (de - à)	1038-1044
Nombre de pages	7
journal	Surface Science
Volume	307-309
Etat de la publication	Publié - 1993

Contient cette citation

@article{6c2bec6d1e4c4b8fbb17bcdf00c4a032,

title = "Inverse photoemission spectroscopy of electron irradiated epitaxial CaF2 on Si(111)",

author = "Saidi Bouzidi and Thierry ANGOT and V{\'e}ronique LANGLAIS and Jean-Marie DEBEVER and Robert Sporken and Jean-Louis Longueville and Paul Thiry",

year = "1993",

language = "English",

volume = "307-309",

pages = "1038--1044",

journal = "Surface Science",

publisher = "Elsevier",

}

TY - JOUR

T1 - Inverse photoemission spectroscopy of electron irradiated epitaxial CaF2 on Si(111)

AU - Bouzidi, Saidi

AU - ANGOT, Thierry

AU - LANGLAIS, Véronique

AU - DEBEVER, Jean-Marie

AU - Sporken, Robert

AU - Longueville, Jean-Louis

AU - Thiry, Paul

PY - 1993

Y1 - 1993

M3 - Article

VL - 307-309

SP - 1038

EP - 1044

JO - Surface Science

JF - Surface Science

ER -