Influence of the organic layer thickness in (metal-assisted) secondary ion mass spectrometry using Ga+ and C60+ projectiles

Nimer Wehbe, Taoufiq Mouhib, Aneesh Prabhakaran, Patrick Bertrand, Arnaud Delcorte

Résultats de recherche: Contribution à un journal/une revue › Article › Revue par des pairs

langue originale	Anglais
journal	Journal of the American Society for Mass Spectrometry
Volume	20
Etat de la publication	Publié - 2009

Contient cette citation

@article{c1e733cd251d4224aa095c16d5d60c27,

title = "Influence of the organic layer thickness in (metal-assisted) secondary ion mass spectrometry using Ga+ and C60+ projectiles",

author = "Nimer Wehbe and Taoufiq Mouhib and Aneesh Prabhakaran and Patrick Bertrand and Arnaud Delcorte",

year = "2009",

language = "English",

volume = "20",

journal = "Journal of the American Society for Mass Spectrometry",

issn = "1044-0305",

publisher = "Springer New York",

}

TY - JOUR

T1 - Influence of the organic layer thickness in (metal-assisted) secondary ion mass spectrometry using Ga+ and C60+ projectiles

AU - Wehbe, Nimer

AU - Mouhib, Taoufiq

AU - Prabhakaran, Aneesh

AU - Bertrand, Patrick

AU - Delcorte, Arnaud

PY - 2009

Y1 - 2009

M3 - Article

SN - 1044-0305

VL - 20

JO - Journal of the American Society for Mass Spectrometry

JF - Journal of the American Society for Mass Spectrometry

ER -