Infiltration of ZnO in mesoporous silicon by isothermal Zn annealing and oxidation

C. De Melo, G. Santana, V. Torres-Costa, M. Behar, J. Ferraz Dias, J. L. Colaux, G. Contreras-Puente, O. De Melo

Résultats de recherche: Contribution à un journal/une revueArticle

Résumé

In this work a two-step procedure is reported for the formation of ZnO/porous silicon (PS) composites in which ZnO is embedded in the pores of sponge like mesoporous silicon. The procedure consists of an isothermal annealing of the PS layer in Zn vapors using a close space configuration and a subsequent oxidation of the Zn infiltrated in the pores. The oxidation agent and the annealing duration are optimized for a complete oxidation of the infiltrated Zn. Structure, morphology and composition of the samples were characterized by X-ray diffraction (XRD), extended X-ray absorption fine structure (EXAFS), Scanning Electron Microscopy (SEM), Energy Dispersive Spectroscopy (EDS), Rutherford backscattering spectrometry (RBS) and photoluminescence (PL). The ZnO/PS composite was observed to exhibit a broad luminescent band covering almost all the visible range.

langue originaleAnglais
Pages (de - à)P6-P11
journalECS Journal of Solid State Science and Technology
Volume5
Numéro de publication2
Les DOIs
étatPublié - 2016
Modification externeOui

Empreinte digitale

Porous silicon
Silicon
Infiltration
Annealing
Oxidation
Isothermal annealing
Composite materials
X ray absorption
Rutherford backscattering spectroscopy
Spectrometry
Energy dispersive spectroscopy
Photoluminescence
Vapors
X ray diffraction
Scanning electron microscopy
Chemical analysis

Citer ceci

De Melo, C. ; Santana, G. ; Torres-Costa, V. ; Behar, M. ; Dias, J. Ferraz ; Colaux, J. L. ; Contreras-Puente, G. ; De Melo, O. / Infiltration of ZnO in mesoporous silicon by isothermal Zn annealing and oxidation. Dans: ECS Journal of Solid State Science and Technology. 2016 ; Vol 5, Numéro 2. p. P6-P11.
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abstract = "In this work a two-step procedure is reported for the formation of ZnO/porous silicon (PS) composites in which ZnO is embedded in the pores of sponge like mesoporous silicon. The procedure consists of an isothermal annealing of the PS layer in Zn vapors using a close space configuration and a subsequent oxidation of the Zn infiltrated in the pores. The oxidation agent and the annealing duration are optimized for a complete oxidation of the infiltrated Zn. Structure, morphology and composition of the samples were characterized by X-ray diffraction (XRD), extended X-ray absorption fine structure (EXAFS), Scanning Electron Microscopy (SEM), Energy Dispersive Spectroscopy (EDS), Rutherford backscattering spectrometry (RBS) and photoluminescence (PL). The ZnO/PS composite was observed to exhibit a broad luminescent band covering almost all the visible range.",
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De Melo, C, Santana, G, Torres-Costa, V, Behar, M, Dias, JF, Colaux, JL, Contreras-Puente, G & De Melo, O 2016, 'Infiltration of ZnO in mesoporous silicon by isothermal Zn annealing and oxidation', ECS Journal of Solid State Science and Technology, VOL. 5, Numéro 2, p. P6-P11. https://doi.org/10.1149/2.0031602jss

Infiltration of ZnO in mesoporous silicon by isothermal Zn annealing and oxidation. / De Melo, C.; Santana, G.; Torres-Costa, V.; Behar, M.; Dias, J. Ferraz; Colaux, J. L.; Contreras-Puente, G.; De Melo, O.

Dans: ECS Journal of Solid State Science and Technology, Vol 5, Numéro 2, 2016, p. P6-P11.

Résultats de recherche: Contribution à un journal/une revueArticle

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T1 - Infiltration of ZnO in mesoporous silicon by isothermal Zn annealing and oxidation

AU - De Melo, C.

AU - Santana, G.

AU - Torres-Costa, V.

AU - Behar, M.

AU - Dias, J. Ferraz

AU - Colaux, J. L.

AU - Contreras-Puente, G.

AU - De Melo, O.

PY - 2016

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AB - In this work a two-step procedure is reported for the formation of ZnO/porous silicon (PS) composites in which ZnO is embedded in the pores of sponge like mesoporous silicon. The procedure consists of an isothermal annealing of the PS layer in Zn vapors using a close space configuration and a subsequent oxidation of the Zn infiltrated in the pores. The oxidation agent and the annealing duration are optimized for a complete oxidation of the infiltrated Zn. Structure, morphology and composition of the samples were characterized by X-ray diffraction (XRD), extended X-ray absorption fine structure (EXAFS), Scanning Electron Microscopy (SEM), Energy Dispersive Spectroscopy (EDS), Rutherford backscattering spectrometry (RBS) and photoluminescence (PL). The ZnO/PS composite was observed to exhibit a broad luminescent band covering almost all the visible range.

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