Hybrid organic/inorganic materials depth profiling by ToF-SIMS using low energy cesium ions

Résultats de recherche: Contribution à un journal/une revue › Article › Revue par des pairs

langue originale	Anglais
journal	Journal of the American Society for Mass Spectrometry
Date de mise en ligne précoce	10 févr. 2016
Les DOIs	https://doi.org/10.1007/s13361-016-1353-9
Etat de la publication	E-pub ahead of print - 10 févr. 2016

Accès au document

@article{1feb5b3e0bbc4745a33ef3bd0a1b402f,

title = "Hybrid organic/inorganic materials depth profiling by ToF-SIMS using low energy cesium ions",

author = "C{\'e}line Noel and Laurent Houssiau",

year = "2016",

month = feb,

day = "10",

doi = "10.1007/s13361-016-1353-9",

language = "English",

journal = "Journal of the American Society for Mass Spectrometry",

issn = "1044-0305",

publisher = "Springer New York",

}

TY - JOUR

T1 - Hybrid organic/inorganic materials depth profiling by ToF-SIMS using low energy cesium ions

AU - Noel, Céline

AU - Houssiau, Laurent

PY - 2016/2/10

Y1 - 2016/2/10

U2 - 10.1007/s13361-016-1353-9

DO - 10.1007/s13361-016-1353-9

M3 - Article

SN - 1044-0305

JO - Journal of the American Society for Mass Spectrometry

JF - Journal of the American Society for Mass Spectrometry

ER -