Hybrid organic/inorganic materials depth profiling by ToF-SIMS using low energy cesium ions

Résultats de recherche: Contribution à un journal/une revue › Article › Revue par des pairs

langue originale	Anglais
journal	Journal of the American Society for Mass Spectrometry
Date de mise en ligne précoce	10 févr. 2016
Les DOIs	https://doi.org/10.1007/s13361-016-1353-9
Etat de la publication	E-pub ahead of print - 10 févr. 2016

Accès au document

Depth profiling of hybrid multilayers using ToF-SIMS: from model samples to photonic devices
Noel, C. (Auteur), Houssiau, L. (Promoteur), Cecchet, F. (Président), Busby, Y. (Jury), Delcorte, A. (Jury), Galtayries, A. (Jury) & Bernard, L. (Jury), 8 avr. 2019
Student thesis: Doc types › Docteur en Sciences

Fichier

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title = "Hybrid organic/inorganic materials depth profiling by ToF-SIMS using low energy cesium ions",

author = "C{\'e}line Noel and Laurent Houssiau",

year = "2016",

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doi = "10.1007/s13361-016-1353-9",

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journal = "Journal of the American Society for Mass Spectrometry",

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AU - Noel, Céline

AU - Houssiau, Laurent

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