High resolution imaging with differential infrared absorption micro-spectroscopy

Isabel Pita, Nordine Hendaoui, Ning Liu, Mahendar Kumbham, Syed A M Tofail, André Peremans, Christophe Silien

Résultats de recherche: Contribution à un journal/une revueArticle

Résumé

Although confocal infrared (IR) absorption micro-spectroscopy is well established for far-field chemical imaging, its scope remains restricted since diffraction limits the spatial resolution to values a little above half the radiation wavelength. Yet, the successful implementations of below-the-diffraction limit far-field fluorescence microscopies using saturated irradiation patterns for example for stimulated-emission depletion and saturated structured-illumination suggest the possibility of using a similar optical patterning strategy for infrared absorption mapping at high resolution. Simulations are used to show that the simple mapping of the difference in transmitted/reflected IR energy between a saturated vortexshaped beam and a Gaussian reference with a confocal microscope affords the generation of high-resolution vibrational absorption images. On the basis of experimentally relevant parameters, the simulations of the differential absorption scheme reveal a spatial resolution better than a tenth of the wavelength for incident energies about a decade above the saturation threshold. The saturated structured illumination concepts are thus expected to be compatible with the establishment of point-like point-spread functions for measuring the absorbance of samples with a scanning confocal microscope recording the differential transmission/reflection.

langueAnglais
Pages25632-25642
Nombre de pages11
journalOptics Express
Volume21
Numéro22
Les DOIs
étatPublié - 4 nov. 2013

Empreinte digitale

infrared absorption
far fields
spatial resolution
illumination
microscopes
high resolution
diffraction
wavelengths
spectroscopy
simulation
energy
point spread functions
stimulated emission
depletion
recording
microscopy
saturation
fluorescence
irradiation
scanning

Citer ceci

Pita, I., Hendaoui, N., Liu, N., Kumbham, M., Tofail, S. A. M., Peremans, A., & Silien, C. (2013). High resolution imaging with differential infrared absorption micro-spectroscopy. Optics Express, 21(22), 25632-25642. DOI: 10.1364/OE.21.025632
Pita, Isabel ; Hendaoui, Nordine ; Liu, Ning ; Kumbham, Mahendar ; Tofail, Syed A M ; Peremans, André ; Silien, Christophe. / High resolution imaging with differential infrared absorption micro-spectroscopy. Dans: Optics Express. 2013 ; Vol 21, Numéro 22. p. 25632-25642
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Pita, I, Hendaoui, N, Liu, N, Kumbham, M, Tofail, SAM, Peremans, A & Silien, C 2013, 'High resolution imaging with differential infrared absorption micro-spectroscopy' Optics Express, VOL 21, Numéro 22, p. 25632-25642. DOI: 10.1364/OE.21.025632

High resolution imaging with differential infrared absorption micro-spectroscopy. / Pita, Isabel; Hendaoui, Nordine; Liu, Ning; Kumbham, Mahendar; Tofail, Syed A M; Peremans, André; Silien, Christophe.

Dans: Optics Express, Vol 21, Numéro 22, 04.11.2013, p. 25632-25642.

Résultats de recherche: Contribution à un journal/une revueArticle

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Pita I, Hendaoui N, Liu N, Kumbham M, Tofail SAM, Peremans A et al. High resolution imaging with differential infrared absorption micro-spectroscopy. Optics Express. 2013 nov. 4;21(22):25632-25642. Disponible �, DOI: 10.1364/OE.21.025632