High resolution depth profiling of nitrogen in AlN layers

Résultats de recherche: Contribution à un journal/une revueArticle

langue originaleAnglais
Pages (de - à)262-266
Nombre de pages5
journalNuclear instruments and methods in physics research B
Volume66
étatPublié - 1992

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@article{3c049f18ba2544f99e5c5cee8b3a0a05,
title = "High resolution depth profiling of nitrogen in AlN layers",
author = "Guy Terwagne and Stephane Lucas and Franz Bodart",
year = "1992",
language = "English",
volume = "66",
pages = "262--266",
journal = "Nuclear Instruments and Methods in Physical Research B",
issn = "0168-583X",
publisher = "Elsevier",

}

High resolution depth profiling of nitrogen in AlN layers. / Terwagne, Guy; Lucas, Stephane; Bodart, Franz.

Dans: Nuclear instruments and methods in physics research B, Vol 66, 1992, p. 262-266.

Résultats de recherche: Contribution à un journal/une revueArticle

TY - JOUR

T1 - High resolution depth profiling of nitrogen in AlN layers

AU - Terwagne, Guy

AU - Lucas, Stephane

AU - Bodart, Franz

PY - 1992

Y1 - 1992

M3 - Article

VL - 66

SP - 262

EP - 266

JO - Nuclear Instruments and Methods in Physical Research B

JF - Nuclear Instruments and Methods in Physical Research B

SN - 0168-583X

ER -