Growth and characterization of CdTe/Si heterostructures: effect of substrate orientation

David John Smith; S.-C. Tsen; D. Chandrasekhar; P. Crozier; Saroj Rujirawat; G. Brill; Yuanping Chen; Robert Sporken; Sivalingam Sivananthan

Growth and characterization of CdTe/Si heterostructures: effect of substrate orientation

David John Smith, S.-C. Tsen, D. Chandrasekhar, P. Crozier, Saroj Rujirawat, G. Brill, Yuanping Chen, Robert Sporken, Sivalingam Sivananthan

Résultats de recherche: Contribution à un journal/une revue › Article

langue originale	Anglais
Pages (de - à)	93-100
Nombre de pages	8
journal	Materials science and engineering. B, Solid-state materials for advanced technology
Numéro de publication	77
Etat de la publication	Publié - 2000

Contient cette citation

@article{3c0593cf36c74895aec4a3e29132c3f5,

title = "Growth and characterization of CdTe/Si heterostructures: effect of substrate orientation",

author = "Smith, {David John} and S.-C. Tsen and D. Chandrasekhar and P. Crozier and Saroj Rujirawat and G. Brill and Yuanping Chen and Robert Sporken and Sivalingam Sivananthan",

note = "Publication code : **RES. ACAD.",

year = "2000",

language = "English",

pages = "93--100",

journal = "Materials science and engineering. B, Solid-state materials for advanced technology",

publisher = "Elsevier",

number = "77",

}

TY - JOUR

T1 - Growth and characterization of CdTe/Si heterostructures

T2 - effect of substrate orientation

AU - Smith, David John

AU - Tsen, S.-C.

AU - Chandrasekhar, D.

AU - Crozier, P.

AU - Rujirawat, Saroj

AU - Brill, G.

AU - Chen, Yuanping

AU - Sporken, Robert

AU - Sivananthan, Sivalingam

N1 - Publication code : **RES. ACAD.

PY - 2000

Y1 - 2000

M3 - Article

SP - 93

EP - 100

JO - Materials science and engineering. B, Solid-state materials for advanced technology

JF - Materials science and engineering. B, Solid-state materials for advanced technology

IS - 77

ER -