EELS and optical response of a noble metal nanoparticle in the frame of a discrete dipole approximation

Résultats de recherche: Contribution à un journal/une revueArticle

Résumé

Surface plasmons of noble metal nanoparticles have recently been studied by Electron Energy-Loss Spectroscopy (EELS) performed in an electron microscope. We present here the basic formalism for EELS simulations in a Discrete Dipole Approximation (DDA) framework for such surface excitations. We compare EELS data and optical properties of a silver triangular nanoprism and show that the spatial variation of surface plasmon excitation probabilities allows to discriminate modes of similar energies. We also emphasize the importance of the substrate polarization effect to reliably describe experimental data. © 2010 Elsevier B.V.
langue originaleAnglais
Pages (de - à)1075-1080
Nombre de pages6
journalUltramicroscopy
Volume110
Numéro de publication8
Les DOIs
étatPublié - 1 juil. 2010

Empreinte digitale

Metal nanoparticles
Electron energy loss spectroscopy
Precious metals
noble metals
energy dissipation
electron energy
dipoles
nanoparticles
approximation
spectroscopy
Plasmons
plasmons
Silver
excitation
Electron microscopes
Optical properties
electron microscopes
silver
Polarization
formalism

Citer ceci

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abstract = "Surface plasmons of noble metal nanoparticles have recently been studied by Electron Energy-Loss Spectroscopy (EELS) performed in an electron microscope. We present here the basic formalism for EELS simulations in a Discrete Dipole Approximation (DDA) framework for such surface excitations. We compare EELS data and optical properties of a silver triangular nanoprism and show that the spatial variation of surface plasmon excitation probabilities allows to discriminate modes of similar energies. We also emphasize the importance of the substrate polarization effect to reliably describe experimental data. {\circledC} 2010 Elsevier B.V.",
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EELS and optical response of a noble metal nanoparticle in the frame of a discrete dipole approximation. / Geuquet, N.; Henrard, L.

Dans: Ultramicroscopy, Vol 110, Numéro 8, 01.07.2010, p. 1075-1080.

Résultats de recherche: Contribution à un journal/une revueArticle

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