Résumé
Electric fields at metal-dielectric contact were calculated analytically and numerically. The obtained field exhibited enhancements strong enough to cause breakdown at a triple junction and more apparently at a quadruple junction. Such field enhancements may lead to a noble type of cold cathode.
langue originale | Anglais |
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titre | 14th IEEE International Vacuum Electronics Conference, IVEC 2013 - Proceedings |
Les DOIs | |
Etat de la publication | Publié - 9 sept. 2013 |
Evénement | 14th IEEE International Vacuum Electronics Conference, IVEC 2013 - Paris, France Durée: 21 mai 2013 → 23 mai 2013 |
Une conférence
Une conférence | 14th IEEE International Vacuum Electronics Conference, IVEC 2013 |
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Pays/Territoire | France |
La ville | Paris |
période | 21/05/13 → 23/05/13 |