Dielectric enhancement of electric fields for a noble cold cathode

M. S. Chung, J. P. Chun, A. Mayer, N. M. Miskovsky, P. H. Cutler

Résultats de recherche: Contribution dans un livre/un catalogue/un rapport/dans les actes d'une conférenceArticle dans les actes d'une conférence/un colloque

Résumé

Electric fields at metal-dielectric contact were calculated analytically and numerically. The obtained field exhibited enhancements strong enough to cause breakdown at a triple junction and more apparently at a quadruple junction. Such field enhancements may lead to a noble type of cold cathode.

langue originaleAnglais
titre14th IEEE International Vacuum Electronics Conference, IVEC 2013 - Proceedings
Les DOIs
étatPublié - 9 sept. 2013
Evénement14th IEEE International Vacuum Electronics Conference, IVEC 2013 - Paris, France
Durée: 21 mai 201323 mai 2013

Une conférence

Une conférence14th IEEE International Vacuum Electronics Conference, IVEC 2013
PaysFrance
La villeParis
période21/05/1323/05/13

Empreinte digitale

Cathodes
Electric fields
Metals

Citer ceci

Chung, M. S., Chun, J. P., Mayer, A., Miskovsky, N. M., & Cutler, P. H. (2013). Dielectric enhancement of electric fields for a noble cold cathode. Dans 14th IEEE International Vacuum Electronics Conference, IVEC 2013 - Proceedings [6570981] https://doi.org/10.1109/IVEC.2013.6570981
Chung, M. S. ; Chun, J. P. ; Mayer, A. ; Miskovsky, N. M. ; Cutler, P. H. / Dielectric enhancement of electric fields for a noble cold cathode. 14th IEEE International Vacuum Electronics Conference, IVEC 2013 - Proceedings. 2013.
@inproceedings{8f772f2b5ced47ac854a2d16bc5757ab,
title = "Dielectric enhancement of electric fields for a noble cold cathode",
abstract = "Electric fields at metal-dielectric contact were calculated analytically and numerically. The obtained field exhibited enhancements strong enough to cause breakdown at a triple junction and more apparently at a quadruple junction. Such field enhancements may lead to a noble type of cold cathode.",
keywords = "cold cathode, field emission, field enhancement, metal-dielectric contact, triple junction",
author = "Chung, {M. S.} and Chun, {J. P.} and A. Mayer and Miskovsky, {N. M.} and Cutler, {P. H.}",
year = "2013",
month = "9",
day = "9",
doi = "10.1109/IVEC.2013.6570981",
language = "English",
isbn = "9781467359757",
booktitle = "14th IEEE International Vacuum Electronics Conference, IVEC 2013 - Proceedings",

}

Chung, MS, Chun, JP, Mayer, A, Miskovsky, NM & Cutler, PH 2013, Dielectric enhancement of electric fields for a noble cold cathode. Dans 14th IEEE International Vacuum Electronics Conference, IVEC 2013 - Proceedings., 6570981, 14th IEEE International Vacuum Electronics Conference, IVEC 2013, Paris, France, 21/05/13. https://doi.org/10.1109/IVEC.2013.6570981

Dielectric enhancement of electric fields for a noble cold cathode. / Chung, M. S.; Chun, J. P.; Mayer, A.; Miskovsky, N. M.; Cutler, P. H.

14th IEEE International Vacuum Electronics Conference, IVEC 2013 - Proceedings. 2013. 6570981.

Résultats de recherche: Contribution dans un livre/un catalogue/un rapport/dans les actes d'une conférenceArticle dans les actes d'une conférence/un colloque

TY - GEN

T1 - Dielectric enhancement of electric fields for a noble cold cathode

AU - Chung, M. S.

AU - Chun, J. P.

AU - Mayer, A.

AU - Miskovsky, N. M.

AU - Cutler, P. H.

PY - 2013/9/9

Y1 - 2013/9/9

N2 - Electric fields at metal-dielectric contact were calculated analytically and numerically. The obtained field exhibited enhancements strong enough to cause breakdown at a triple junction and more apparently at a quadruple junction. Such field enhancements may lead to a noble type of cold cathode.

AB - Electric fields at metal-dielectric contact were calculated analytically and numerically. The obtained field exhibited enhancements strong enough to cause breakdown at a triple junction and more apparently at a quadruple junction. Such field enhancements may lead to a noble type of cold cathode.

KW - cold cathode

KW - field emission

KW - field enhancement

KW - metal-dielectric contact

KW - triple junction

UR - http://www.scopus.com/inward/record.url?scp=84883432284&partnerID=8YFLogxK

U2 - 10.1109/IVEC.2013.6570981

DO - 10.1109/IVEC.2013.6570981

M3 - Conference contribution

AN - SCOPUS:84883432284

SN - 9781467359757

BT - 14th IEEE International Vacuum Electronics Conference, IVEC 2013 - Proceedings

ER -

Chung MS, Chun JP, Mayer A, Miskovsky NM, Cutler PH. Dielectric enhancement of electric fields for a noble cold cathode. Dans 14th IEEE International Vacuum Electronics Conference, IVEC 2013 - Proceedings. 2013. 6570981 https://doi.org/10.1109/IVEC.2013.6570981