Depth-profiling of implanted 28Si by (alpha,alpha) and (alpha,p) reactions

Depth-profiling of implanted ²⁸Si by (alpha,alpha) and (alpha,p) reactions

Julien Demarche, Mourad Yedji, Guy Terwagne

Résultats de recherche: Contribution à un journal/une revue › Article › Revue par des pairs

langue originale	Anglais
Pages (de - à)	2107-2110
Nombre de pages	4
journal	Nuclear instruments and methods in physics research B
Volume	B268
Etat de la publication	Publié - 2010

@article{bf3a2fb52d384185a9ec962f298ad755,

title = "Depth-profiling of implanted 28Si by (alpha,alpha) and (alpha,p) reactions",

author = "Julien Demarche and Mourad Yedji and Guy Terwagne",

year = "2010",

language = "English",

volume = "B268",

pages = "2107--2110",

journal = "Nuclear instruments and methods in physics research B",

issn = "0168-583X",

publisher = "Elsevier",

}