Contribution of secondary fluorescence in the lateral resolution of a PIXE microprobe

Guy Demortier, Gilles Mathot

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    Résumé

    Matrix effects on the measurement of elements having close atomic masses using -PIXE are studied with emphasis to Ni and Co inclusions in iron matrices. Postulating that all the major components may be simultaneously detected through at least one well-isolated peak for each of them, and that a known reference material is available which contains all the elements of the unknown sample, we propose a direct method to extract the actual distribution of all elements during the scanning with a narrow microprobe.
    langue originaleAnglais
    Pages (de - à)169-175
    Nombre de pages7
    journalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
    Volume210
    Les DOIs
    Etat de la publicationPublié - 2003

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