Concerns and their Separation in Feature Diagram Languages - An Informal Survey

Thein Than Tun; Patrick Heymans

Concerns and their Separation in Feature Diagram Languages - An Informal Survey

Faculte d'informatique

Résultats de recherche: Contribution dans un livre/un catalogue/un rapport/dans les actes d'une conférence › Article dans les actes d'une conférence/un colloque

langue originale	Anglais
titre	Proceedings of the Workshop on Scalable Modelling Techniques for Software Product Lines (SCALE@SPLC'09), San Francisco, CA, USA
Etat de la publication	Publié - 2009

Model-driven engineering
Cleve, A. (Co-investigateur)
1/01/10 → 31/01/10
Projet: Axe de recherche

Contient cette citation

@inproceedings{5c2e8ad777004ef5b8cea31aaa200d21,

title = "Concerns and their Separation in Feature Diagram Languages - An Informal Survey",

author = "Tun, {Thein Than} and Patrick Heymans",

year = "2009",

language = "English",

booktitle = "Proceedings of the Workshop on Scalable Modelling Techniques for Software Product Lines (SCALE@SPLC'09), San Francisco, CA, USA",

}

Concerns and their Separation in Feature Diagram Languages - An Informal Survey. / Tun, Thein Than; Heymans, Patrick.
Proceedings of the Workshop on Scalable Modelling Techniques for Software Product Lines (SCALE@SPLC'09), San Francisco, CA, USA. 2009.

Résultats de recherche: Contribution dans un livre/un catalogue/un rapport/dans les actes d'une conférence › Article dans les actes d'une conférence/un colloque

Concerns and their Separation in Feature Diagram Languages - An Informal Survey

Projets

Model-driven engineering

Contient cette citation