Chemical analysis of the interface in bulk-heterojunction solar cells by X-ray photoelectron spectroscopy depth profiling

Titre traduit de la contribution: Analyse chimique des interface dans des cellules solaires à hétérojonction bulk par profilage XPS

Yan Busby, Emil J W List-Kratochvil, Jean-Jacques Pireaux

    Résultats de recherche: Contribution à un journal/une revueArticleRevue par des pairs

    Résumé

    Despite the wide use of blends combining an organic p-type polymer and molecular fullerene-based electron acceptor, the proper characterization of such bulk heterojunction materials is still challenging. To highlight structure-to-function relations and improve the device performance, advanced tools and strategies need to be developed to characterize composition and interfaces with sufficient accuracy. In this work, high-resolution X-ray photoelectron spectroscopy (XPS) is combined with very low energy argon ion beam sputtering to perform a nondestructive depth profile chemical analysis on full Al/P3HT:PCBM/PEDOT:PSS/ITO (P3HT, poly(3-hexylthiophene); PCBM, [6,6]-phenyl-C61-butyric acid methyl ester; PEDOT, poly(3,4-ethylenedioxythiophene; PSS, polystyrenesulfonate; ITO, indium tin oxide) bulk-heterojunction solar cell device stacks. Key information, such as P3HT and PCBM composition profiles and Al-PCBM chemical bonding, are deduced in this basic device structure. The interface chemical analysis allows us to evidence, with unprecedented accuracy, the inhomogeneous distribution of PCBM, characterized by a strong segregation toward the top metal electrode. The chemical analysis highresolution spectra allows us to reconstruct P3HT/PCBM ratio through the active layer depth and correlate with the device deposition protocol and performance. Results evidence an inhomogeneous P3HT/PCBM ratio and poorly controllable PCBM migration, which possibly explains the limited light-to-power conversion efficiency in this basic device structure. The work illustrates the high potential of XPS depth profile analysis for studying such organic/inorganic device stacks.

    Titre traduit de la contributionAnalyse chimique des interface dans des cellules solaires à hétérojonction bulk par profilage XPS
    langue originaleAnglais
    Pages (de - à)3842-3848
    Nombre de pages7
    journalACS Applied Materials & Interfaces
    Volume9
    Numéro de publication4
    Les DOIs
    Etat de la publicationPublié - 1 févr. 2017

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