In this work, the composition and morphology of WO films loaded with different levels of Ag, prepared by screen-printing onto Si substrates and annealed in air were investigated. The TEM micrography showed that the films are grain-like; the grain size increases with the increase of the Ag loading level. The Raman spectroscopy showed the formation of a AgWO bronze structure. XPS and ToF-SIMS results showed that while undergoing annealing, the Ag atoms migrate to the surface forming clusters. The molecular images obtained by ToF-SIMS showed that the NH binds preferentially at the surface of the Ag clusters. No preferential binding site was found for hydrocarbon contamination.
Empreinte digitaleExaminer les sujets de recherche de « Characterization of WO<sub>3</sub>:Ag films: ToF-SIMS studies of ammonia adsorption ». Ensemble, ils forment une empreinte digitale unique.
Plateforme technologique Synthese, irradiation et analyse des materiaux
Equipement/installations: Plateforme technolgique