Characterization of WO3:Ag films: ToF-SIMS studies of ammonia adsorption

C. Bittencourt, M.P. Felicissimo, A. Felten, L.A.O. Nunes, P. Ivanov, E. Llobet, J.-J. Pireaux, L. Houssiau

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In this work, the composition and morphology of WO films loaded with different levels of Ag, prepared by screen-printing onto Si substrates and annealed in air were investigated. The TEM micrography showed that the films are grain-like; the grain size increases with the increase of the Ag loading level. The Raman spectroscopy showed the formation of a AgWO bronze structure. XPS and ToF-SIMS results showed that while undergoing annealing, the Ag atoms migrate to the surface forming clusters. The molecular images obtained by ToF-SIMS showed that the NH binds preferentially at the surface of the Ag clusters. No preferential binding site was found for hydrocarbon contamination.
langue originaleAnglais
Pages (de - à)21-28
Nombre de pages8
journalApplied Surface Science
Numéro de publication1-4
Les DOIs
Etat de la publicationPublié - 31 août 2005

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