Characterization of WO3:Ag films: ToF-SIMS studies of ammonia adsorption

C. Bittencourt, M.P. Felicissimo, A. Felten, L.A.O. Nunes, P. Ivanov, E. Llobet, J.-J. Pireaux, L. Houssiau

Résultats de recherche: Contribution à un journal/une revueArticle

Résumé

In this work, the composition and morphology of WO films loaded with different levels of Ag, prepared by screen-printing onto Si substrates and annealed in air were investigated. The TEM micrography showed that the films are grain-like; the grain size increases with the increase of the Ag loading level. The Raman spectroscopy showed the formation of a AgWO bronze structure. XPS and ToF-SIMS results showed that while undergoing annealing, the Ag atoms migrate to the surface forming clusters. The molecular images obtained by ToF-SIMS showed that the NH binds preferentially at the surface of the Ag clusters. No preferential binding site was found for hydrocarbon contamination.
langue originaleAnglais
Pages (de - à)21-28
Nombre de pages8
journalApplied Surface Science
Volume250
Numéro de publication1-4
Les DOIs
étatPublié - 31 août 2005

Empreinte digitale

Secondary ion mass spectrometry
Ammonia
Adsorption
Screen printing
Bronze
Binding sites
Hydrocarbons
Raman spectroscopy
Contamination
X ray photoelectron spectroscopy
Binding Sites
Annealing
Transmission electron microscopy
Atoms
Substrates
Air
Chemical analysis

Citer ceci

Bittencourt, C. ; Felicissimo, M.P. ; Felten, A. ; Nunes, L.A.O. ; Ivanov, P. ; Llobet, E. ; Pireaux, J.-J. ; Houssiau, L. / Characterization of WO3:Ag films : ToF-SIMS studies of ammonia adsorption. Dans: Applied Surface Science. 2005 ; Vol 250, Numéro 1-4. p. 21-28.
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abstract = "In this work, the composition and morphology of WO films loaded with different levels of Ag, prepared by screen-printing onto Si substrates and annealed in air were investigated. The TEM micrography showed that the films are grain-like; the grain size increases with the increase of the Ag loading level. The Raman spectroscopy showed the formation of a AgWO bronze structure. XPS and ToF-SIMS results showed that while undergoing annealing, the Ag atoms migrate to the surface forming clusters. The molecular images obtained by ToF-SIMS showed that the NH binds preferentially at the surface of the Ag clusters. No preferential binding site was found for hydrocarbon contamination.",
author = "C. Bittencourt and M.P. Felicissimo and A. Felten and L.A.O. Nunes and P. Ivanov and E. Llobet and J.-J. Pireaux and L. Houssiau",
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Characterization of WO3:Ag films : ToF-SIMS studies of ammonia adsorption. / Bittencourt, C.; Felicissimo, M.P.; Felten, A.; Nunes, L.A.O.; Ivanov, P.; Llobet, E.; Pireaux, J.-J.; Houssiau, L.

Dans: Applied Surface Science, Vol 250, Numéro 1-4, 31.08.2005, p. 21-28.

Résultats de recherche: Contribution à un journal/une revueArticle

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T1 - Characterization of WO3:Ag films

T2 - ToF-SIMS studies of ammonia adsorption

AU - Bittencourt, C.

AU - Felicissimo, M.P.

AU - Felten, A.

AU - Nunes, L.A.O.

AU - Ivanov, P.

AU - Llobet, E.

AU - Pireaux, J.-J.

AU - Houssiau, L.

PY - 2005/8/31

Y1 - 2005/8/31

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