Characterization of Ag doped SnO2 for gas sensing application

A. Ouerdane, M. Ghaffour, Z. Hachoun, M. Abdelkrim, M. Bedrouni, Y. Caudano

Résultats de recherche: Contribution à un journal/une revueArticleRevue par des pairs


We used Transmission Electron Microscopy TEM, Energy Dispersive X-ray (EDX), X-ray Diffraction (XRD) and impedance spectroscopy to study SnO2 doped by sputtered Ag atoms on its surface. The morphology of the surface texture showed large Ag islands in SnO2 bulk when the system was submitted to heating. These results were well confirmed by EDX spectrum, TEM scanning micrograph and impedance spectroscopy. Furthermore, TRIM software was used to show the effects of nuclear and electron stopping range on optical properties of the crystal Ag-SnO2 and the depth reached by Ag into SnO2 bulk.

langue originaleAnglais
Pages (de - à)66-73
Nombre de pages8
journalJournal of Surface Science and Technology
Numéro de publication1-2
Les DOIs
Etat de la publicationPublié - 1 juin 2018

Contient cette citation