Characterization of Ag doped SnO2 for gas sensing application

A. Ouerdane, M. Ghaffour, Z. Hachoun, M. Abdelkrim, M. Bedrouni, Y. Caudano

Résultats de recherche: Contribution à un journal/une revueArticle

Résumé

We used Transmission Electron Microscopy TEM, Energy Dispersive X-ray (EDX), X-ray Diffraction (XRD) and impedance spectroscopy to study SnO2 doped by sputtered Ag atoms on its surface. The morphology of the surface texture showed large Ag islands in SnO2 bulk when the system was submitted to heating. These results were well confirmed by EDX spectrum, TEM scanning micrograph and impedance spectroscopy. Furthermore, TRIM software was used to show the effects of nuclear and electron stopping range on optical properties of the crystal Ag-SnO2 and the depth reached by Ag into SnO2 bulk.

langue originaleAnglais
Pages (de - à)66-73
Nombre de pages8
journalJournal of Surface Science and Technology
Volume34
Numéro de publication1-2
Les DOIs
étatPublié - 1 juin 2018

Empreinte digitale

Gases
Transmission electron microscopy
transmission electron microscopy
gases
Spectroscopy
impedance
X rays
x rays
stopping
spectroscopy
textures
Optical properties
Textures
computer programs
Scanning
Heating
optical properties
X ray diffraction
Atoms
Crystals

Citer ceci

Ouerdane, A. ; Ghaffour, M. ; Hachoun, Z. ; Abdelkrim, M. ; Bedrouni, M. ; Caudano, Y. / Characterization of Ag doped SnO2 for gas sensing application. Dans: Journal of Surface Science and Technology. 2018 ; Vol 34, Numéro 1-2. p. 66-73.
@article{445806132d074702bfd1dafdc4081103,
title = "Characterization of Ag doped SnO2 for gas sensing application",
abstract = "We used Transmission Electron Microscopy TEM, Energy Dispersive X-ray (EDX), X-ray Diffraction (XRD) and impedance spectroscopy to study SnO2 doped by sputtered Ag atoms on its surface. The morphology of the surface texture showed large Ag islands in SnO2 bulk when the system was submitted to heating. These results were well confirmed by EDX spectrum, TEM scanning micrograph and impedance spectroscopy. Furthermore, TRIM software was used to show the effects of nuclear and electron stopping range on optical properties of the crystal Ag-SnO2 and the depth reached by Ag into SnO2 bulk.",
keywords = "Ag-SnO, Doping, EDX, TEM, TRIM, XRD",
author = "A. Ouerdane and M. Ghaffour and Z. Hachoun and M. Abdelkrim and M. Bedrouni and Y. Caudano",
year = "2018",
month = "6",
day = "1",
doi = "10.18311/jsst/2018/14738",
language = "English",
volume = "34",
pages = "66--73",
journal = "Journal of Surface Science and Technology",
issn = "0970-1893",
publisher = "Indian Society for Surface Science and Technology",
number = "1-2",

}

Ouerdane, A, Ghaffour, M, Hachoun, Z, Abdelkrim, M, Bedrouni, M & Caudano, Y 2018, 'Characterization of Ag doped SnO2 for gas sensing application', Journal of Surface Science and Technology, VOL. 34, Numéro 1-2, p. 66-73. https://doi.org/10.18311/jsst/2018/14738

Characterization of Ag doped SnO2 for gas sensing application. / Ouerdane, A.; Ghaffour, M.; Hachoun, Z.; Abdelkrim, M.; Bedrouni, M.; Caudano, Y.

Dans: Journal of Surface Science and Technology, Vol 34, Numéro 1-2, 01.06.2018, p. 66-73.

Résultats de recherche: Contribution à un journal/une revueArticle

TY - JOUR

T1 - Characterization of Ag doped SnO2 for gas sensing application

AU - Ouerdane, A.

AU - Ghaffour, M.

AU - Hachoun, Z.

AU - Abdelkrim, M.

AU - Bedrouni, M.

AU - Caudano, Y.

PY - 2018/6/1

Y1 - 2018/6/1

N2 - We used Transmission Electron Microscopy TEM, Energy Dispersive X-ray (EDX), X-ray Diffraction (XRD) and impedance spectroscopy to study SnO2 doped by sputtered Ag atoms on its surface. The morphology of the surface texture showed large Ag islands in SnO2 bulk when the system was submitted to heating. These results were well confirmed by EDX spectrum, TEM scanning micrograph and impedance spectroscopy. Furthermore, TRIM software was used to show the effects of nuclear and electron stopping range on optical properties of the crystal Ag-SnO2 and the depth reached by Ag into SnO2 bulk.

AB - We used Transmission Electron Microscopy TEM, Energy Dispersive X-ray (EDX), X-ray Diffraction (XRD) and impedance spectroscopy to study SnO2 doped by sputtered Ag atoms on its surface. The morphology of the surface texture showed large Ag islands in SnO2 bulk when the system was submitted to heating. These results were well confirmed by EDX spectrum, TEM scanning micrograph and impedance spectroscopy. Furthermore, TRIM software was used to show the effects of nuclear and electron stopping range on optical properties of the crystal Ag-SnO2 and the depth reached by Ag into SnO2 bulk.

KW - Ag-SnO

KW - Doping

KW - EDX

KW - TEM

KW - TRIM

KW - XRD

UR - http://www.scopus.com/inward/record.url?scp=85049974392&partnerID=8YFLogxK

U2 - 10.18311/jsst/2018/14738

DO - 10.18311/jsst/2018/14738

M3 - Article

AN - SCOPUS:85049974392

VL - 34

SP - 66

EP - 73

JO - Journal of Surface Science and Technology

JF - Journal of Surface Science and Technology

SN - 0970-1893

IS - 1-2

ER -