Projets par an
Résumé
This work aims at measuring the proton induced secondary electron energy spectra from nanometer thin films. Backscattered electron energy spectra were measured within an energy range from 0 to 600 eV using a Retarding Field Analyser (RFA). This paper presents energy spectra obtained for proton (0.5 MeV; 1 MeV; 1.5 MeV; 2 MeV) irradiation of thin carbon films (50 and 100 nm thick) and thin gold film (200 nm). These experimental spectra were compared with Monte Carlo simulations based on TRAX code and Geant4 simulation toolkit. Good agreement between experimental, TRAX and Geant4 results were observed for the carbon target. For the gold target, we report major differences between both Monte Carlo environments. Limitation of Geant4 models for low energy electron emission was highlighted. On the contrary, TRAX simulations present encouraging results for the modeling of low-energy electron emission from gold target.
langue originale | Anglais |
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Pages (de - à) | 8-17 |
Nombre de pages | 10 |
journal | Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms |
Volume | 401 |
Les DOIs | |
Etat de la publication | Publié - 15 juin 2017 |
Empreinte digitale
Examiner les sujets de recherche de « Backscattered electron emission after proton impact on carbon and gold films: Experiments and simulations ». Ensemble, ils forment une empreinte digitale unique.Projets
- 1 Terminé
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THERAPLUS: Amélioration de la radiothérapie externe grâce à l'utilisation de nano-objets métalliques
Heuskin, A.-C. (Chercheur), Lucas, S. (Responsable du Projet), Michiels, C. (Co-investigateur), Feron, O. (Co-investigateur), Gallez, B. (Co-investigateur) & MARTINIVE, P. (Co-investigateur)
1/05/14 → 1/05/17
Projet: Recherche
Équipement
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Synthèse, Irradiation et Analyse de Matériaux (SIAM) (2016 - ...)
Louette, P. (!!Manager), Colaux, J. (!!Manager), Felten, A. (!!Manager), Tabarrant, T. (!!Operator), COME, F. (!!Operator) & Debarsy, P.-L. (!!Manager)
Plateforme technologique Synthese, irradiation et analyse des materiauxEquipement/installations: Plateforme technolgique