Automated and scalable t-wise test case generation strategies for software product lines

G. Perrouin, S. Sen, J. Klein, B. Baudry, Y. Le Traon

Résultats de recherche: Contribution dans un livre/un catalogue/un rapport/dans les actes d'une conférenceArticle dans les actes d'une conférence/un colloque

Résumé

Software Product Lines (SPL) are difficult to validate due to combinatorics induced by variability across their features. This leads to combinatorial explosion of the number of derivable products. Exhaustive testing in such a large space of products is infeasible. One possible option is to test SPLs by generating test cases that cover all possible T feature interactions (T-wise). T-wise dramatically reduces the number of test products while ensuring reasonable SPL coverage. However, automatic generation of test cases satisfying T-wise using SAT solvers raises two issues. The encoding of SPL models and T-wise criteria into a set of formulas acceptable by the solver and their satisfaction which fails when processed “all-at-once'”. We propose a scalable toolset using Alloy to automatically generate test cases satisfying T-wise from SPL models. We define strategies to split T-wise combinations into solvable subsets. We design and compute metrics to evaluate strategies on Aspect OPTIMA, a concrete transactional SPL.
langue originaleAnglais
titreThird International Conference on Software Testing, Verification and Validation (ICST)
Lieu de publicationParis
EditeurIEEE
Pages459-468
Nombre de pages10
ISBN (imprimé)978-1-4244-6435-7
Les DOIs
étatPublié - 2010

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Perrouin, G., Sen, S., Klein, J., Baudry, B., & Le Traon, Y. (2010). Automated and scalable t-wise test case generation strategies for software product lines. Dans Third International Conference on Software Testing, Verification and Validation (ICST) (p. 459-468). Paris: IEEE. https://doi.org/10.1109/ICST.2010.43
Perrouin, G. ; Sen, S. ; Klein, J. ; Baudry, B. ; Le Traon, Y. / Automated and scalable t-wise test case generation strategies for software product lines. Third International Conference on Software Testing, Verification and Validation (ICST). Paris : IEEE, 2010. p. 459-468
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Perrouin, G, Sen, S, Klein, J, Baudry, B & Le Traon, Y 2010, Automated and scalable t-wise test case generation strategies for software product lines. Dans Third International Conference on Software Testing, Verification and Validation (ICST). IEEE, Paris, p. 459-468. https://doi.org/10.1109/ICST.2010.43

Automated and scalable t-wise test case generation strategies for software product lines. / Perrouin, G.; Sen, S.; Klein, J.; Baudry, B.; Le Traon, Y.

Third International Conference on Software Testing, Verification and Validation (ICST). Paris : IEEE, 2010. p. 459-468.

Résultats de recherche: Contribution dans un livre/un catalogue/un rapport/dans les actes d'une conférenceArticle dans les actes d'une conférence/un colloque

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Perrouin G, Sen S, Klein J, Baudry B, Le Traon Y. Automated and scalable t-wise test case generation strategies for software product lines. Dans Third International Conference on Software Testing, Verification and Validation (ICST). Paris: IEEE. 2010. p. 459-468 https://doi.org/10.1109/ICST.2010.43