Projets par an
Résumé
Mutation analysis is a popular test assessment method. It relies on the mutation score, which indicates how many mutants are revealed by a test suite. Yet, there are mutants whose behaviour is equivalent to the original system, wasting analysis resources and preventing the satisfaction of the full (100%) mutation score. For finite behavioural models, the Equivalent Mutant Problem (EMP) can be addressed through language equivalence of non-deterministic finite automata, which is a well-studied, yet computationally expensive, problem in automata theory. In this paper, we report on our preliminary assessment of a state-of-the-art exact language equivalence tool to handle the EMP against 3 models of size up to 15,000 states on 1170 mutants. We introduce random and mutation-biased simulation heuristics as baselines for comparison. Results show that the exact approach is often more than ten times faster in the weak mutation scenario. For strong mutation, our biased simulations are faster for models larger than 300 states. They can be up to 1,000 times faster while limiting the error of misclassifying non-equivalent mutants as equivalent to 10% on average. We therefore conclude that the approaches can be combined for improved efficiency.
langue originale | Anglais |
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titre | Proceedings - 10th IEEE International Conference on Software Testing, Verification and Validation, ICST 2017 |
Lieu de publication | Tokyo, Japan |
Editeur | IEEE |
Pages | 424-429 |
Nombre de pages | 6 |
ISBN (Electronique) | 9781509060313 |
Les DOIs | |
Etat de la publication | Publié - 15 mai 2017 |
Evénement | 10th IEEE International Conference on Software Testing, Verification and Validation (ICST 2017) - Tokyo, Japon Durée: 13 mars 2017 → 18 mars 2017 Numéro de conférence: 10 http://aster.or.jp/conference/icst2017/ |
Série de publications
Nom | 2017 IEEE International Conference on Software Testing, Verification and Validation (ICST) |
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Une conférence
Une conférence | 10th IEEE International Conference on Software Testing, Verification and Validation (ICST 2017) |
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Titre abrégé | ICST 2017 |
Pays/Territoire | Japon |
La ville | Tokyo |
période | 13/03/17 → 18/03/17 |
Adresse Internet |
Empreinte digitale
Examiner les sujets de recherche de « Automata Language Equivalence vs. Simulations for Model-based Mutant Equivalence: An Empirical Evaluation ». Ensemble, ils forment une empreinte digitale unique.Projets
- 2 Terminé
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FEDER-IDEES Co-Innovation: Co-Innovation
HEYMANS, P. (Responsable du Projet)
1/01/15 → 31/12/20
Projet: Recherche
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Thesis-X-Devroey: Behavioural Model Based Testing of Software Product Lines
Devroey, X. (Chercheur), Heymans, P. (Co-investigateur), Schobbens, P. Y. (Co-investigateur) & Perrouin, G. (Chercheur)
1/09/11 → 30/08/17
Projet: Projet de thèse
Activités
- 1 Participation à une conférence, un congrès
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10th IEEE International Conference on Software Testing, Verification and Validation (ICST 2017)
Devroey, X. (Conférencier)
13 mars 2017 → 18 mars 2017Activité: Participation ou organisation d'un événement › Participation à une conférence, un congrès
Thèses de l'étudiant
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Behavioural model-based testing of software product lines
Devroey, X. (Auteur), Schobbens, P.-Y. (Promoteur), Heymans, P. (Promoteur), Englebert, V. (Président), Baudry, B. (Jury), Cohen, M. B. (Jury), Legay, A. (Jury) & Perrouin, G. (Jury), 30 août 2017Student thesis: Doc types › Docteur en Sciences
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