Résumé
The atomic structure of a carbon nanotube can be described by its chiral angle and diameter and can be specified by a pair of lattice indices (n,m). The electronic and mechanical properties are critically dependent on these indices. Scanning tunneling microscopy (STM) is a useful tool to investigate carbon nanotubes since the atomic structure as well as the electronic properties of individual molecules can be determined. This paper presents a discussion of the technique to obtain (n,m) indices of nanotubes from STM images in combination with current-voltage tunnel spectra. Image contrast, distortion effects, and determination of chiral angle and diameter are discussed. The procedure of (n,m) identification is demonstrated for a few single-walled carbon nanotubes.
langue originale | Anglais |
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Pages (de - à) | 2991-2996 |
Nombre de pages | 6 |
journal | Physical Review. B, Condensed Matter and Materials Physics |
Volume | 61 |
Numéro de publication | 4 |
Les DOIs | |
Etat de la publication | Publié - 2000 |