Accurate electronics calibration for particle backscattering spectrometry

Julien L. Colaux; Chris Jeynes

doi:10.1039/c4ay02988g

Accurate electronics calibration for particle backscattering spectrometry

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Résumé

Rutherford backscattering spectrometry (RBS) is a non-destructive thin film analytical technique of the highest absolute accuracy which, when used for elemental depth profiling, depends at first order on the gain of the pulse-height spectrometry system. We show here for the first time how this gain can be reliably and robustly determined at about 0.1%. This journal is

langue originale	Anglais
Pages (de - à)	3096-3104
Nombre de pages	9
journal	Analytical Methods
Volume	7
Numéro de publication	7
Les DOIs	https://doi.org/10.1039/c4ay02988g
Etat de la publication	Publié - 7 avr. 2015
Modification externe	Oui

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10.1039/c4ay02988g

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abstract = "Rutherford backscattering spectrometry (RBS) is a non-destructive thin film analytical technique of the highest absolute accuracy which, when used for elemental depth profiling, depends at first order on the gain of the pulse-height spectrometry system. We show here for the first time how this gain can be reliably and robustly determined at about 0.1%. This journal is",

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Accurate electronics calibration for particle backscattering spectrometry

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