Abstract test case generation for behavioural testing of software product lines

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Résumé

In Model Based Testing (MBT), test cases are generated automatically from a partial representation of expected behaviour of the System Under Test (SUT) (i.e., the model). For most industrial systems, it is impossible to generate all the possible test cases from the model. The test engineer recourse to generation algorithms that maximize a given coverage criterion, a metric indicating the percentage of possible behaviours of the SUT covered by the test cases. Our previous work redefined classical Transition Systems (TSs) criteria for SPLs, using Featured Transition Systems (FTSs), a mathematical structure to compactly represent the behaviour of a SPL, as model for test case generation. In this paper, we provide one all-states coverage driven generation algorithm and discuss its scalability and efficiency with respect to random generation. All-states and random generation are compared on fault-seeded FTSs.

langue originaleAnglais
titreACM International Conference Proceeding Series
Lieu de publicationFlorence, Italy
EditeurACM Press
Pages86-93
Nombre de pages8
Volume2
ISBN (imprimé)9781450327398
Les DOIs
Etat de la publicationPublié - 15 sept. 2014
Evénement18th International Software Product Line Conference, SPLC 2014 - Florence, Italie
Durée: 15 sept. 201419 sept. 2014

Série de publications

NomSPLC '14
EditeurACM

Une conférence

Une conférence18th International Software Product Line Conference, SPLC 2014
PaysItalie
La villeFlorence
période15/09/1419/09/14

    Empreinte digitale

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