Thomas Seldrum

  • 82 Citations
  • 4 h-Index
19992011
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Ingénierie et Science des Matériaux

Scanning tunneling microscopy
Annealing
Multiwalled carbon nanotubes (MWCN)
Carbon nanotubes
Molecular beam epitaxy
Spectroscopy
Low energy electron diffraction
Polymers
Auger electron spectroscopy
Coalescence
Cadmium telluride
Physisorption
Ions
Temperature
Photoemission
Photolithography
Luminescence
Restoration
Sputtering
Microscopic examination
Thin films
Scaffolds
Pyridine
Organic solvents
Self assembly
Toluene
Substrates
Linear systems
Thermogravimetric analysis
Molecular dynamics
Atomic force microscopy
X ray photoelectron spectroscopy
Transmission electron microscopy
Derivatives
Carbon
Computer simulation

composés chimiques

Carbon Nanotubes
Multiwalled carbon nanotubes (MWCN)
Scanning tunneling microscopy
Polymers
Annealing
Spectroscopy
Ions
Carbon Monoxide
Luminescence
Restoration
Sputtering
Uracil
Toluene
Thin films
Dimethyl Sulfoxide
Scaffolds
Organic solvents
Self assembly
Linear systems
Thermogravimetric analysis
Molecular dynamics
Atomic force microscopy
Carbon
X ray photoelectron spectroscopy
Transmission electron microscopy
Derivatives
Computer simulation

Physique & Astronomie

Engineering

annealing
lithography
sputtering

General

scanning tunneling microscopy
coalescing
attenuation
restoration
energy
microscopy
temperature dependence
causes
thin films
interactions

Aerospace Sciences

Auger spectroscopy
electron spectroscopy
mass spectroscopy

Chemistry and Materials

molecular beam epitaxy
cadmium tellurides

Physics

electron diffraction
room temperature
ions
photoelectric emission
cycles
temperature

Mathematical and Computer Sciences

matrices