Nimer Wehbe

  • 248 Citations
  • 10 h-Index
20032014
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Profil personnel

Présentation

Research activities October 2008 - Current Situation Post-Doc researcher - Interdisciplinary Laboratory for Electron Spectroscopy (LISE), University of Namur, Namur-Belgium. European project FP7: Combined SIMS-SFM Instrument for the 3-dimensional chemical analysis of nanostructures (3D NANOCHEMISCOPE) September 2006 - September 2008 Post-Doc researcher. Physical-Chemistry and Material Physics Laboratory (PCPM), Catholic University of Louvain, Louvain-la-Neuve-Belgium. European project FP6, Networks of Excellence: Nanoanalysis using finely focused ion and electron beams (Nanobeams).

Domaines de compétence

- Strong background in surface analysis techniques, in particular Secondary Ions Mass Spectrometry (TOF-SIMS).
I handled TOF-SIMS equipments using atomic beams such as
Ga+,In+,Cs+, Xe+, and polyatomic beams such as O2+, Aun+ (n up to
13) and C60+.
Static SIMS on metallic and organic samples (polymeric and
non-polymeric films).
Dynamic SIMS: Depth profiling of organic layers.

- Strong practical knowledge of sample preparation by spin-coating (bio-molecules and polymers).

- Preparation of organic layers by evaporation of organic molecules under vacuum.

- General knowledge and few experiences using Scanning Electron Microscopy (SEM) and Atomic Force Microscopy (AFM).

- Thickness measurements using profilometry technique.

- General knowledge on the nuclear techniques for surface analysis (PIXE, RBS, NRA) acquired during the full-time training at the Lebanese Atomic Energy Commission, Scientific Council for Scientific Research of Lebanon - Beirut-Lebanon.

Diplômes

September 2002 - June 2006 PhD (Physic) prepared and defended at the Institute of Nuclear Physics of Lyon (IPNL), Université Claude Bernard Lyon-I (UCBL), Lyon-France.

2001 - 2002 Postgraduate Certificate, Master's degree: Science and Analytical strategies (Analytical Chemistry). Université Claude Bernard Lyon-I. Lyon-France.

1999 - 2000 Master I degree (BAC+4) in Chemistry - Lebanese University - Faculty of sciences. Beirut-Lebanon.

Présentation

Research activities October 2008 - Current Situation Post-Doc researcher - Interdisciplinary Laboratory for Electron Spectroscopy (LISE), University of Namur, Namur-Belgium. European project FP7: Combined SIMS-SFM Instrument for the 3-dimensional chemical analysis of nanostructures (3D NANOCHEMISCOPE) September 2006 - September 2008 Post-Doc researcher. Physical-Chemistry and Material Physics Laboratory (PCPM), Catholic University of Louvain, Louvain-la-Neuve-Belgium. European project FP6, Networks of Excellence: Nanoanalysis using finely focused ion and electron beams (Nanobeams).

Domaines de compétence

- Strong background in surface analysis techniques, in particular Secondary Ions Mass Spectrometry (TOF-SIMS).
I handled TOF-SIMS equipments using atomic beams such as
Ga+,In+,Cs+, Xe+, and polyatomic beams such as O2+, Aun+ (n up to
13) and C60+.
Static SIMS on metallic and organic samples (polymeric and
non-polymeric films).
Dynamic SIMS: Depth profiling of organic layers.

- Strong practical knowledge of sample preparation by spin-coating (bio-molecules and polymers).

- Preparation of organic layers by evaporation of organic molecules under vacuum.

- General knowledge and few experiences using Scanning Electron Microscopy (SEM) and Atomic Force Microscopy (AFM).

- Thickness measurements using profilometry technique.

- General knowledge on the nuclear techniques for surface analysis (PIXE, RBS, NRA) acquired during the full-time training at the Lebanese Atomic Energy Commission, Scientific Council for Scientific Research of Lebanon - Beirut-Lebanon.

Diplômes

September 2002 - June 2006 PhD (Physic) prepared and defended at the Institute of Nuclear Physics of Lyon (IPNL), Université Claude Bernard Lyon-I (UCBL), Lyon-France.

2001 - 2002 Postgraduate Certificate, Master's degree: Science and Analytical strategies (Analytical Chemistry). Université Claude Bernard Lyon-I. Lyon-France.

1999 - 2000 Master I degree (BAC+4) in Chemistry - Lebanese University - Faculty of sciences. Beirut-Lebanon.

Empreinte digitale Examinez les sujets de recherche où Nimer Wehbe est actif. Ces libellés de rubriques sont le fruit de recherches menées par cette personne. Ensemble, ils forment une empreinte digitale unique.

  • 15 Profils similaires
Depth profiling composés chimiques
Secondary ion mass spectrometry composés chimiques
Ions composés chimiques
secondary ion mass spectrometry Physique & Astronomie
Sputtering composés chimiques
Cesium composés chimiques
Fullerenes composés chimiques
Argon composés chimiques

Résultat de recherche 2003 2014

  • 248 Citations
  • 10 h-Index
  • 20 Article

Comparison of fullerene and large argon clusters for the molecular depth profiling of amino acid multilayers

Wehbe, N., Mouhib, T., Delcorte, A., Bertrand, P., Moellers, R., Niehuis, E. & Houssiau, L., 1 janv. 2014, Dans : Analytical and Bioanalytical Chemistry. 406, 1, p. 201-211 11 p.

Résultats de recherche: Contribution à un journal/une revueArticle

Fullerenes
Depth profiling
Argon
Silicon
Sputtering

In-depth diffusion of oxygen into LDPE exposed to an Ar–O2 atmospheric post-discharge: a complementary approach between AR-XPS and Tof-SIMS techniques

Abou Rich, S., Leroy, P., Dufour, T., Wehbe, N., Houssiau, L. & Reniers, F., 5 févr. 2014, Dans : Surface and interface analysis. 46, 3, p. 164-174 11 p., 10.1002/sia.403.

Résultats de recherche: Contribution à un journal/une revueArticle

XPS evidence for negative ion formation in SIMS depth profiling of organic material with cesium

Wehbe, N., Pireaux, J. J. & Houssiau, L., 2014, Dans : Journal of Physical Chemistry C. 118, 46, p. 26613-26620 8 p.

Résultats de recherche: Contribution à un journal/une revueArticle

Cesium
phenylalanine
Depth profiling
Secondary ion mass spectrometry
organic materials

Molecular depth profiling of organic photovoltaic heterojunction layers by ToF-SIMS: Comparative evaluation of three sputtering beams

Mouhib, T., Poleunis, C., Wehbe, N., Michels, J. J., Galagan, Y., Houssiau, L., Bertrand, P. & Delcorte, A., 21 nov. 2013, Dans : Analyst. 138, 22, p. 6801-6810 10 p.

Résultats de recherche: Contribution à un journal/une revueArticle

Secondary Ion Mass Spectrometry
Butyric Acid
Depth profiling
Secondary ion mass spectrometry
Artifacts

TOF-SIMS depth profiling of multilayer amino-acid films using large Argon cluster Arn+, C60+ and Cs+ sputtering ions: A comparative study

Wehbe, N., Tabarrant, T., Brison, J., Mouhib, T., Delcorte, A., Bertrand, P., Moellers, R., Niehuis, E. & Houssiau, L., 1 janv. 2013, Dans : Surface and interface analysis. 45, 1, p. 178-180 3 p.

Résultats de recherche: Contribution à un journal/une revueArticle

Depth profiling
Argon
Secondary ion mass spectrometry
secondary ion mass spectrometry
Sputtering

Activités 2005 2009

  • 21 Participation à une conférence, un congrès
  • 2 Participation à un atelier/workshop, un séminaire, un cours

ECASIA'09 - 13 European Conference on Applications of Surface and Interface analysis , Antalya, Turkey.

Nimer Wehbe (Poster)
18 oct. 200923 oct. 2009

Activité: Types de Participation ou d'organisation d'un événementParticipation à une conférence, un congrès

The 17th International Conference on Secondary Ion Mass Spectrometry , Toronto, Canada.

Nimer Wehbe (Orateur)
14 sept. 200918 sept. 2009

Activité: Types de Participation ou d'organisation d'un événementParticipation à une conférence, un congrès

The 17th International Conference on Secondary Ion Mass Spectrometry , Toronto, Canada.

Nimer Wehbe (Orateur)
14 sept. 200918 sept. 2009

Activité: Types de Participation ou d'organisation d'un événementParticipation à une conférence, un congrès

The 17th International Conference on Secondary Ion Mass Spectrometry , Toronto, Canada.

Nimer Wehbe (Orateur)
14 sept. 200918 sept. 2009

Activité: Types de Participation ou d'organisation d'un événementParticipation à une conférence, un congrès

The 17th International Conference on Secondary Ion Mass Spectrometry , Toronto, Canada.

Nimer Wehbe (Orateur)
14 sept. 200918 sept. 2009

Activité: Types de Participation ou d'organisation d'un événementParticipation à une conférence, un congrès