Preparation and observation of corss-sectionnal view by Transmission Electron Microscopy

    Activité: Types de Participation ou d'organisation d'un événementParticipation à une conférence, un congrès

    Description

    Cross-sectional TEM view was required to observe the buried carbon nitride compounds obtained by carbon and nitrogen implantation within copper matrix. This was carried out using a double-beam Focused Ion Beam (FIB) system consisting of a JEOL 5910 SEM co
    Période5 janv. 200920 mars 2009
    Type d'événementSéjour à l'étranger
    LieuUniversity of Salford, United Kingdom