On the understanding of ionization and cluster formation processes during ToF-SIMS depth profiling by Co-sputtering cesium and xenon

Student thesis: Doc typesDoctor of Sciences

Abstract

Date of Award2007
Original languageEnglish
SupervisorLaurent Houssiau (Supervisor), Stéphane Lucas (Jury), Jean-Jacques Pireaux (Jury), Patrick Bertrand (Jury) & Ewald Niehuis (Jury)

Cite this

On the understanding of ionization and cluster formation processes during ToF-SIMS depth profiling by Co-sputtering cesium and xenon
Brison, J. (Author). 2007

Student thesis: Doc typesDoctor of Sciences