| Date of Award | 26 Jun 2007 |
|---|---|
| Original language | English |
| Supervisor | Laurent Houssiau (Supervisor), Stephane Lucas (Jury), Jean-Jacques Pireaux (Jury), Patrick Bertrand (Jury) & Ewald Niehuis (Jury) |
On the understanding of ionization and cluster formation processes during ToF-SIMS depth profiling by Co-sputtering cesium and xenon
Student thesis: Doc types › Doctor of Sciences