Modélisation des phénomènes de champ proche optique en microscopie et en interférométrie

Abstract

Thanks to a method based on green's tensors, we have modelled near-field optics phenomena in the framework of: - near-field optical microscopy, in which a dielectric tip, coated or not with metal, interacts with the surface to be analysed; - interferometry, well-known in geometrical optics, demonstrating in near-field particular behaviours that could be used also in microscopy. These models were compared sucessfully with experiments performed in the domain of SNOM (Scanning Near-field Microscopy).

Date of Award	1996
Original language	English