Defect characterisation of sputtered, nitrided and ion implanted systems using the new Ghent slow positron facility

  • Jérémy DEBAERDEMAEKER

Student thesis: Doc typesDoctor of Sciences

Date of Award2004
Original languageEnglish
SupervisorGuy Terwagne (Jury), Charles DAUWE (Supervisor), Paul MATTHYS (Jury), Danny SEGERS (Jury), Eddy DE GRAEVE (Jury), Luc VAN HORENBEKE (Jury) & Roland VANMEIRHAEGHE (Jury)

Cite this

'