Defect characterisation of sputtered, nitrided and ion implanted systems using the new Ghent slow positron facility

  • Jérémy DEBAERDEMAEKER

Student thesis: Doc typesDoctor of Sciences

Abstract

Date of Award2004
Original languageEnglish
SupervisorGuy Terwagne (Jury), Charles DAUWE (Supervisor), Paul MATTHYS (Jury), Danny SEGERS (Jury), Eddy DE GRAEVE (Jury), Luc VAN HORENBEKE (Jury) & Roland VANMEIRHAEGHE (Jury)

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