XPS study of polymer chain conformation in amorphous and crystalline poly(ethyleneterephthalate) samples: is the sensitivity limit reached

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)53-73
Number of pages21
JournalJ. Electron Spectroscopy
Volume63
Publication statusPublished - 1993

Cite this

@article{2118c9fcceb84b768b1890e1c817c44a,
title = "XPS study of polymer chain conformation in amorphous and crystalline poly(ethyleneterephthalate) samples: is the sensitivity limit reached",
author = "Pierre Boulanger and Jean-Jacques Pireaux and Jacques Verbist and Joseph Delhalle",
year = "1993",
language = "English",
volume = "63",
pages = "53--73",
journal = "J. Electron Spectroscopy",

}

TY - JOUR

T1 - XPS study of polymer chain conformation in amorphous and crystalline poly(ethyleneterephthalate) samples: is the sensitivity limit reached

AU - Boulanger, Pierre

AU - Pireaux, Jean-Jacques

AU - Verbist, Jacques

AU - Delhalle, Joseph

PY - 1993

Y1 - 1993

M3 - Article

VL - 63

SP - 53

EP - 73

JO - J. Electron Spectroscopy

JF - J. Electron Spectroscopy

ER -