XPS profiling of Biosensors Materials with a Argon Cluster Ions.

Jean-Jacques Pireaux, Pierre Louette, Laurent Houssiau, Nimer Wehbe, P. Mack, R.G. White, T.S. Nunney

Research output: Contribution in Book/Catalog/Report/Conference proceedingChapter (peer-reviewed)peer-review

Original languageEnglish
Title of host publicationProceedings of the AVS 59th International Symposium and Exhibition, Tampa , Florida, USA
Publication statusPublished - 2012
EventAVS, 59th International Symposium and Exhibition - Tampa, FL., United States
Duration: 28 Oct 20122 Nov 2012

Conference

ConferenceAVS, 59th International Symposium and Exhibition
CountryUnited States
CityTampa, FL.
Period28/10/122/11/12

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