XPS profiling of Biosensors Materials with a Argon Cluster Ions.

Jean-Jacques Pireaux, Pierre Louette, Laurent Houssiau, Nimer Wehbe, P. Mack, R.G. White, T.S. Nunney

Research output: Contribution in Book/Catalog/Report/Conference proceeding › Chapter (peer-reviewed) › peer-review

Original language	English
Title of host publication	Proceedings of the AVS 59th International Symposium and Exhibition, Tampa , Florida, USA
Publication status	Published - 2012
Event	AVS, 59th International Symposium and Exhibition - Tampa, FL., United States Duration: 28 Oct 2012 → 2 Nov 2012

Conference	AVS, 59th International Symposium and Exhibition
Country/Territory	United States
City	Tampa, FL.
Period	28/10/12 → 2/11/12

Cite this

@inbook{cc4a52fbca034254bdcff7b117c92c24,

title = "XPS profiling of Biosensors Materials with a Argon Cluster Ions.",

author = "Jean-Jacques Pireaux and Pierre Louette and Laurent Houssiau and Nimer Wehbe and P. Mack and R.G. White and T.S. Nunney",

year = "2012",

language = "English",

booktitle = "Proceedings of the AVS 59th International Symposium and Exhibition, Tampa , Florida, USA",

note = "AVS, 59th International Symposium and Exhibition ; Conference date: 28-10-2012 Through 02-11-2012",

}

TY - CHAP

T1 - XPS profiling of Biosensors Materials with a Argon Cluster Ions.

AU - Pireaux, Jean-Jacques

AU - Louette, Pierre

AU - Houssiau, Laurent

AU - Wehbe, Nimer

AU - Mack, P.

AU - White, R.G.

AU - Nunney, T.S.

PY - 2012

Y1 - 2012

M3 - Chapter (peer-reviewed)

BT - Proceedings of the AVS 59th International Symposium and Exhibition, Tampa , Florida, USA

T2 - AVS, 59th International Symposium and Exhibition

Y2 - 28 October 2012 through 2 November 2012

ER -